Search Results1-8 of  8

  • BANDOH Akira ID: 9000004767379

    Quality Assurance Department TDK Corporation (2000 from CiNii)

    Articles in CiNii:1

    • High Performance EMI Evaluation System (2000)
  • BANDOH Akira ID: 9000017392400

    Corporate R&D Center, Showa Denko K.K. (2010 from CiNii)

    Articles in CiNii:1

    • Growth of GaInN by Raised-Pressure Metalorganic Vapor Phase Epitaxy (2010)
  • BANDOH Akira ID: 9000107313633

    Corporate R&D Center, Showa-Denko K.K. (2007 from CiNii)

    Articles in CiNii:1

    • Dislocations in AlN Epilayers Grown on Sapphire Substrate by High-Temperature Metal-Organic Vapor Phase Epitaxy (2007)
  • Bandoh Akira ID: 9000082850076

    Articles in CiNii:1

    • High-Temperature Metal-Organic Vapor Phase Epitaxial Growth of AlN on Sapphire by Multi Transition Growth Mode Method Varying V/III Ratio (2006)
  • Bandoh Akira ID: 9000345218797

    Showa Denko K. K. (2017 from CiNii)

    Articles in CiNii:1

    • Development Status of New Material Power Devices (2017)
  • Bandoh Akira ID: 9000401568506

    Articles in CiNii:1

    • Growth of GaInN by Raised-Pressure Metalorganic Vapor Phase Epitaxy (2010)
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