Search Results1-5 of  5

  • BAE Jaecheol ID: 9000107354097

    Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD (2005 from CiNii)

    Articles in CiNii:1

    • Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc (2005)
  • Bae Jaecheol ID: 9000024992944

    Articles in CiNii:1

    • Bit Error Rate Characteristics of Write Once Read Many Super-Resolution Near Field Structure Disk (Special Issue: Optical Memories) (2006)
  • Bae Jaecheol ID: 9000025120871

    Articles in CiNii:1

    • Error rate reduction of super-resolution near-field structure disc (Special issue: Optical memories) (2007)
  • Bae Jaecheol ID: 9000258182120

    Digital Media R&D Center, SAMSUNG ELECTRONICS CO., LTD (2005 from CiNii)

    Articles in CiNii:1

    • Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc (2005)
  • Bae Jaecheol ID: 9000401737209

    Articles in CiNii:1

    • Improvement of Noise Characteristics in Super-Resolution Near-Field Structure Disc (2005)
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