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  • THIRSTRUP Carsten ID: 9000253326932

    Surface and Interface Laboratory, The Institute of Physical and Chemical Research|Core Research for Evolutional Science and Technology (CREST) Program, Japan Science and Technology Corporation (JST). (1998 from CiNii)

    Articles in CiNii:1

    • How to measure the nanoscale physical properties of materials? (1998)
  • THIRSTRUP Carsten ID: 9000253649346

    The Institute of Physical and Chemical Research (RIKEN)|Core Research for Evolutional Science and Technology (CREST) Program, Japan Science and Technology Corporation (JST) (1998 from CiNii)

    Articles in CiNii:1

    • Nanoscale Semiconductor Processes Using STM and AFM Lithographies. Formation of Silicon Dangling Bonds Using STM Lithography and Its Decoration. (1998)
  • THIRSTRUP Carsten ID: 9000253649354

    Surface and Interface Laboratory, The Institute of Physical and Chemical Research (RIKEN)|Core Research for Evolutional Science and Technology (CREST) Program, Japan Science and Technology Corporation (JST) (1998 from CiNii)

    Articles in CiNii:1

    • Nanoscale Semiconductor Processes Using STM and AFM Lithographies. The Present and Future of Nano-Lithography Using Scanning Probes. How to Measure the Properties of Nano-Lithographed Structures.:How to Measure the Properties of Nano-Lithographed Structures (1998)
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