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  • CHEN Shui-Hung ID: 9000107383632

    Articles in CiNii:1

    • The Method to Optimize Gate Oxide Integrity, Hot Carrier Effect and Electro-Static Discharge without Sacrificing the Performance in Sub-Quarter Micron Dual Gate Oxide Process (1999)
  • Chen Shui-Hung ID: 9000401685524

    Articles in CiNii:1

    • The Method to Optimize Gate Oxide Integrity, Hot Carrier Effect and Electro-Static Discharge without Sacrificing the Performance in Sub-Quarter Micron Dual Gate Oxide Process (1999)
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