Search Results1-5 of  5

  • CHO Eun Suk ID: 9000002173249

    Device Research Team (2006 from CiNii)

    Articles in CiNii:1

    • FinFET NAND Flash with Nitride/Si Nanocrystal/Nitride Hybrid Trap Layer (2006)
  • Cho Eun Suk ID: 9000058611497

    Articles in CiNii:1

    • Fin-Type Field-Effect Transistor NAND Flash with Nitride/Silicon Nanocrystal/Nitride Hybrid Trap Layer (2007)
  • Cho Eun Suk ID: 9000258179748

    Device Research Team, Semiconductor R&D Center, Samsung Electronics Co. (2005 from CiNii)

    Articles in CiNii:1

    • Highly Manufacturable and Reliable 80-nm Gate Twin Silicon-Oxide-Nitride-Oxide-Silicon Memory Transistor (2005)
  • Cho Eun Suk ID: 9000283901612

    Dept. of Industrial Chemistry, Kyungpook National University, Korea (2004 from CiNii)

    Articles in CiNii:1

    • Effect of Al<SUB>2</SUB>O<SUB>3</SUB> Addition on Catalytic Activities of NiSO<SUB>4</SUB>/Al<SUB>2</SUB>O<SUB>3</SUB>-ZrO<SUB>2</SUB> for Acid Catalysis (2004)
  • Cho Eun Suk ID: 9000401743241

    Articles in CiNii:1

    • Highly Manufacturable and Reliable 80-nm Gate Twin Silicon-Oxide-Nitride-Oxide-Silicon Memory Transistor (2005)
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