Search Results1-4 of  4

  • EHARA Keigo ID: 9000004778090

    Toyo Kohan Corp. (1997 from CiNii)

    Articles in CiNii:1

    • Evaluation of Emitter Materials by Ultra-High Vacuum Scanning Maxwell-Stress Microscope (UHV-SMM) (1997)
  • EHARA Keigo ID: 9000005717031

    Toyokohan Co., Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • Fabrication of Metal-Oxide-Semiconductor Field-Effect-Transistor-Structured Silicon Field Emitters with a Polysilicon Dual Gate (1997)
  • Ehara Keigo ID: 9000258134449

    Toyokohan Co., Ltd., 1296 Higashitoyoi, Kudamatsu, Yamaguchi 744, Japan (1997 from CiNii)

    Articles in CiNii:1

    • Fabrication of Metal-Oxide-Semiconductor Field-Effect-Transistor-Structured Silicon Field Emitters with a Polysilicon Dual Gate. (1997)
  • Ehara Keigo ID: 9000401668211

    Articles in CiNii:1

    • Fabrication of Metal-Oxide-Semiconductor Field-Effect-Transistor-Structured Silicon Field Emitters with a Polysilicon Dual Gate (1997)
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