Search Results1-20 of  190

  • Endo Kazuhiko ID: 9000009563259

    Articles in CiNii:1

    • Fluorinated Amorphous Carbon Thin Films for Multilevel Interconnections of Integrated Circuits (1999)
  • Endo Kazuhiko ID: 9000024980013

    Articles in CiNii:1

    • Experimental study of physical-vapor-deposited titanium nitride gate with An n[+]-polycrystalline silicon capping layer and its application to 20nm fin-type double-gate metal-oxide-semiconductor field-effect transistors (Special issue: Solid state devices and materials) (2011)
  • Endo Kazuhiko ID: 9000025017270

    Articles in CiNii:1

    • Investigation of low-energy tilted ion implantation for fin-type double-gate metal-oxide-semiconductor field-effect transistor extension doping (Special issue: Solid state devices and materials) (2010)
  • Endo Kazuhiko ID: 9000025017398

    Articles in CiNii:1

    • Investigation of thermal stability of TiN film formed by atomic layer deposition using tetrakis(dimethylamino)titanium precursor for metal-gate metal-oxide-semiconductor field-effect transistor (Special issue: Solid state devices and materials) (2010)
  • Endo Kazuhiko ID: 9000025069107

    Articles in CiNii:1

    • Fabrication of a Vertical-Channel Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistor Using a Neutral Beam Etching (2006)
  • Endo Kazuhiko ID: 9000025078379

    Articles in CiNii:1

    • Experimental Comparisons between Tetrakis(dimethylamino)titanium Precursor-Based Atomic-Layer-Deposited and Physical-Vapor-Deposited Titanium-Nitride Gate for High-Performance Fin-Type Metal-Oxide-Semiconductor Field-Effect Transistors (Special Issue : Solid State Devices and Materials (2)) (2012)
  • Endo Kazuhiko ID: 9000025083644

    Articles in CiNii:1

    • Nanoscale wet etching of physical-vapor-deposited titanium nitride and its application to sub-30-nm-gate-length fin-type double-gate metal-oxide-semiconductor field-effect transistor fabrication (Special issue: Microprocesses and nanotechnology) (2010)
  • Endo Kazuhiko ID: 9000025096470

    Articles in CiNii:1

    • Demonstration and Analysis of Accumulation-Mode Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistor (Special Issue: Solid State Devices & Materials) (2006)
  • Endo Kazuhiko ID: 9000025096472

    Articles in CiNii:1

    • Investigation of N-Channel Triple-Gate Metal-Oxide-Semiconductor Field-Effect Transistors on (100) Silicon on Insulator Substrate (Special Issue: Solid State Devices & Materials) (2006)
  • Endo Kazuhiko ID: 9000241500219

    Articles in CiNii:1

    • 1/f Noise Characteristics of Fin-Type Field-Effect Transistors in Saturation Region (Special Issue : Solid State Devices and Materials) (2013)
  • Endo Kazuhiko ID: 9000241877884

    Articles in CiNii:1

    • Atomic Layer Deposition of SiO₂ for the Performance Enhancement of Fin Field Effect Transistors (2013)
  • ENDO Kazuhiko ID: 1000070168821

    Articles in CiNii:310

    • Relationships among Cell Behaviors and Surface Characteristics of the Dental Metallic Implant (1995)
    • Hotはお好き? -1997年北海道夏期セミナー報告- (1998)
    • 「小特集/生体材料と細胞・組織の界面」の企画に当たって (1998)
  • ENDO Kazuhiko ID: 9000000059072

    Articles in CiNii:21

    • 1996年SMPTEプログレスリポート(上) (1997)
    • 映像制作とモーションキャプチャー (1998)
    • Digital Laser Film Recorder from ARRI (2000)
  • ENDO Kazuhiko ID: 9000000664582

    Articles in CiNii:2

    • Evaluation of Deep-Drawing Lubricants for Aluminum Sheets of Autobody by Draw-Bead Test (1993)
    • 機械加工油 (潤滑油の実用性能と評価・試験法<特集>) (1994)
  • ENDO Kazuhiko ID: 9000000706952

    Department of Dental Materials Science, School of Dentistry, Health Sciences University of Hokkaido (1998 from CiNii)

    Articles in CiNii:1

    • In vivo Corrosion and Tarnish of Dental Au-based and Ag-based Alloy Restorations (1998)
  • ENDO Kazuhiko ID: 9000001037234

    Silicon Systems Research Laboratories, NEC Corporation (2003 from CiNii)

    Articles in CiNii:1

    • Metal Organic Atomic Layer Deposition of High-k Gate Dielectrics Using Plasma Oxidation (2003)
  • ENDO Kazuhiko ID: 9000001212657

    Department of Surgery, Akita Kumiai Hospital (2003 from CiNii)

    Articles in CiNii:1

    • Eosinophilic colitis accompanied by Tolosa-Hunt syndrome : report of a case (2003)
  • ENDO Kazuhiko ID: 9000001721094

    Microelectronics Research Laboratories, NEC Corporation (1996 from CiNii)

    Articles in CiNii:1

    • Effect of Bias Addition on the Gap-Filling Properties of Fluorinated Amorphous Carbon Thin Films Grown by Helicon Wave Plasma Enhanced Chemical Vapor Deposition (1996)
  • ENDO Kazuhiko ID: 9000001721473

    Microelectronics Research Laboratories, NEC Corporation (1995 from CiNii)

    Articles in CiNii:1

    • Nitrogen Doped Fluorinated Amorphous Carbon Thin Films Grown by Plasma Enhanced Chemical Vapor Deposition (1995)
  • ENDO Kazuhiko ID: 9000001814213

    National Institute of Advanced Industrial Science and Technology (AIST) (2006 from CiNii)

    Articles in CiNii:1

    • Deoxidization of Cu Oxide under Extremely Low Oxygen Pressure Ambient (2006)
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