Search Results1-13 of  13

  • FUKURA Jiro ID: 9000020040499

    Articles in CiNii:1

    • X-Ray Stress Measurement on the Cementite Phase in Steels (1969)
  • FUKURA Jiro ID: 9000020040889

    Articles in CiNii:1

    • Method of X-Ray Stress Measurement for Very Broad Diffraction Lines with a Diffractometer (1966)
  • FUKURA Jiro ID: 9000020218312

    Articles in CiNii:1

    • X-Ray Stress Measurement on the Cementite Phase in Steel (1969)
  • FUKURA Jiro ID: 9000020285053

    Department of Mechanical Engineering, Anan Technical College (1980 from CiNii)

    Articles in CiNii:1

    • Annealing Effect of Internal Stress in Evaporated Silver Films (1980)
  • FUKURA Jiro ID: 9000021145857

    Articles in CiNii:1

    • Evaluation of Various Techniques of X-Ray Stress Measurement with Diffractometer (1966)
  • FUKURA Jiro ID: 9000021146010

    Articles in CiNii:1

    • Method of Successive Calculation of Separation of Kα Doublet (1967)
  • FUKURA Jiro ID: 9000021147104

    Articles in CiNii:1

    • Automatic Focusing Apparatus on a Diffractometer (1965)
  • FUKURA Jiro ID: 9000021177303

    Articles in CiNii:1

    • Improvement of Diffractometer for X-Ray Stress Measurement:Automatic Focusing Apparatus (1965)
  • FUKURA Jiro ID: 9000021500731

    Faculty of Engineering, Tokushima University (1967 from CiNii)

    Articles in CiNii:1

    • X-Ray Stress Measurement of Coarse Polycrystalline Materials by Means of a Diffractometer (1967)
  • FUKURA Jiro ID: 9000021606017

    Department of Mechanical Engineering, Anan Technical College (1975 from CiNii)

    Articles in CiNii:1

    • Internal Stress in Evaporated Silver Films (1975)
  • FUKURA Jiro ID: 9000253320995

    Department of Mechanical Engineering, Anan Technical College, (1977 from CiNii)

    Articles in CiNii:1

    • Internal Strain in Vacuum-Deposited Silver Films Removed from Substrate (1977)
  • FUKURA Jiro ID: 9000253322417

    Department of Mechanical Engineering, Anan Technical College (1981 from CiNii)

    Articles in CiNii:1

    • Interpretation of the Stress in Crystalline Grains of Silver Films Removed from Substrates (1981)
  • Fukura Jiro ID: 9000002648221

    Faculty of Engineering,Tokushima University (1967 from CiNii)

    Articles in CiNii:4

    • The Effects of the X-Ray Absorption on X-Ray Stress Measurements (1965)
    • On the Measurement of the Very Small Displacement by the Optical Interference Method and its Application (1965)
    • Accuracy of Three Point Parabola Fitting Method Locating the Peak of Diffraction Line in X-ray Stress Measurement (1967)
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