Search Results1-20 of  127

  • Fukuda Koichi ID: 9000241500781

    Articles in CiNii:1

    • Quantitative Evaluation of Dopant Concentration in Shallow Silicon p-n Junctions by Tunneling Current Mapping with Multimode Scanning Probe Microscopy (Special Issue : Solid State Devices and Materials) (2013)
  • FUKUDA KOICHI ID: 9000020645526

    Department of Parasitology, National Defense Medical College (1985 from CiNii)

    Articles in CiNii:1

    • Simplified slide preparation in the circumoval precipitin (COP) test for field survey. (1985)
  • FUKUDA KOICHI ID: 9000254742019

    Nihon Senshoku Co., Ltd. (1968 from CiNii)

    Articles in CiNii:1

    • A Review of The Flame-Proofing for Textiles (1968)
  • FUKUDA KOICHI ID: 9000254742026

    Nihon Senshoku Co., Ltd. (1968 from CiNii)

    Articles in CiNii:1

    • A Review of the Flame-Proofing for Textiles (1968)
  • FUKUDA KOICHI ID: 9000256193553

    Fukuda Cemical Laboratory, Inc. (1975 from CiNii)

    Articles in CiNii:1

    • A Review of AATCC 1974 National Technical Confrence (1975)
  • FUKUDA KOICHI ID: 9000378110602

    Division of Biomedical Engineering, Research Institute, National Defense Medical College (2017 from CiNii)

    Articles in CiNii:1

    • Stability of Weakly Acidic Hypochlorous Acid Solution with Microbicidal Activity (2017)
  • FUKUDA KOICHI ID: 9000398155043

    Division of Biomedical Engineering, Research Institute, National Defense Medical College (2018 from CiNii)

    Articles in CiNii:1

    • Behavior of Nitrate-Nitrogen and Nitrite-Nitrogen in Drinking Water (2018)
  • FUKUDA KOICHI ID: 9000402925242

    Division of Biomedical Engineering, Research Institute, National Defense Medical College (2019 from CiNii)

    Articles in CiNii:1

    • Comparison of Various Disinfectants on Bactericidal Activity Under Organic Matter Contaminated Environments (2019)
  • FUKUDA Koichi ID: 9000001029316

    三木プーリ株式会社 技術本部センタプロダクトチーム (2004 from CiNii)

    Articles in CiNii:2

    • Material Technology for Coupling (2003)
    • Miki Pulley Co., Ltd (2004)
  • FUKUDA Koichi ID: 9000001578030

    Articles in CiNii:5

    • A prospect regarding to the function, content and method of agricultural extension, and epectation for Agricultural Extension Research Society of Japan (2005)
    • 農業普及の機能・内容・方法に関する一考察および日本農業普及学会への期待 (2005)
    • A Study Analyzing the Current Situation and Trends of Agricultural Extension Systems according to their Classification in Developed Countries : Considering the Future Direction of the Agricultural Extension System in Japan (2006)
  • FUKUDA Koichi ID: 9000002704130

    Articles in CiNii:71

    • Evaluation of The Bethesda System (TBS) in diagnostic cytology (2001)
    • Anthropometric and Other Risk Factors for Ovarian Cancer in a Case-Control Study (1998)
    • 婦人科腫瘍と局所免疫機構 (2002)
  • FUKUDA Koichi ID: 9000004739660

    Faculty of Information Science, Meisei University (2005 from CiNii)

    Articles in CiNii:33

    • Adaptive Wavelet Coding for 3-D Geometry Data Considering the Characteristics of Normal Vectors on the Model Surface (2003)
    • Compression of Polygonal Mesh Data using Triangular Lattice Structuring with Extended Node (2000)
    • A Still Image Coding Method Applying AR Model Estimation to DCT Coefficients of the Edge Blocks (1993)
  • FUKUDA Koichi ID: 9000004777964

    Oki Electric Industry Co., Ltd. (2006 from CiNii)

    Articles in CiNii:28

    • Undoped Thin Film FD-SOI CMOS with Source/Drain-to-Gate Non-overlapped Structure for Ultra Low Leak Applications (2006)
    • インバ-スモデリング技術を用いたMOSFETチャネルプロファイル抽出法の開発 (1997)
    • TCADを用いた半導体製造プロセスの最適化 (半導体特集) -- (先端プロセスとデバイス技術) (1999)
  • FUKUDA Koichi ID: 9000004811321

    OKI Electric Industry Co., Ltd. (2003 from CiNii)

    Articles in CiNii:7

    • A New Wide Applicable Mobility Model for Device Simulation Taking Physics-Based Carrier Screening Effects into Account (1995)
    • Systematic Yield Simulation Methodology Applied to Fully-Depleted SOI MOSFET Process (2000)
    • A Simplified Process Modeling for Reverse Short Channel Effect of Threshold Voltage of MOSFET (2001)
  • FUKUDA Koichi ID: 9000004813154

    R amp D Div., FRONTEC Inc. (1996 from CiNii)

    Articles in CiNii:1

    • Improvement of PECVD-SiN_x for TFT Gate Insulator by Controlling Ion Bombardment Energy (1996)
  • FUKUDA Koichi ID: 9000004835028

    Faculty of Science and Technology, Sophia University (2004 from CiNii)

    Articles in CiNii:1

    • Wavelet Coding of Structured Geometry Data on Triangular Lattice Plane Considering Rate-Distortion Properties (2004)
  • FUKUDA Koichi ID: 9000004976630

    Articles in CiNii:3

    • Design technology for 64 Gbit 2-bit multilevel-cell NAND flash memory using 24 nm process (2011)
    • Design of 8Gb NAND Flash Memory with 70nm CMOS Technology (2005)
    • A 151mm^2 64Gbit 2bit/cell NAND Flash Memory Fabricated in 24nm Technology (2011)
  • FUKUDA Koichi ID: 9000005097648

    日本総合研究所 (1998 from CiNii)

    Articles in CiNii:1

    • 火力発電所定期検査計画における最適化スケジューリング(スケジューリング) (1998)
  • FUKUDA Koichi ID: 9000005690991

    Department of Ecosystem Engineering, Graduate School of Engineering, the University of Tokushima (1998 from CiNii)

    Articles in CiNii:1

    • Self-Organizing Three-Dimensional Colloidal Photonic Crystal Structure with Augmented Dielectric Contrast (1998)
  • FUKUDA Koichi ID: 9000006210560

    Hitachi Displays, Ltd. (2006 from CiNii)

    Articles in CiNii:4

    • Optical Design and Viewing Charactaristics of Transflective IPS-LCDs (2006)
    • Optical Design and Viewing Charactaristics of Transflective IPS-LCDs (2006)
    • Optical Design and Viewing Charactaristics of Transflective IPS-LCDs (2006)
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