Search Results1-7 of  7

  • Furumai Kouhei ID: 9000025031164

    Articles in CiNii:1

    • Thermal stability and scalability of mictamict Ti-Si-N metal-oxide-semiconductor gate electrodes (Special issue: Solid state devices and materials) (2009)
  • Furumai Kouhei ID: 9000025031336

    Articles in CiNii:1

    • Nitrogen-content dependence of crystalline structures and resistivity of Hf-Si-N gate electrodes for metal-oxide-semiconductor field-effect transistors (2009)
  • Furumai Kouhei ID: 9000025038499

    Articles in CiNii:1

    • Crystalline and electrical properties of mictamict TiSiN gate metal-oxcide-semiconductor capacitors (Special issue: Solid state devices and materials) (2008)
  • FURUMAI Kouhei ID: 9000002172939

    Graduate School of Engineering, Nagoya University (2007 from CiNii)

    Articles in CiNii:2

    • Composition Dependence of Work Function in Metal (Ni, Pt)-Germanide Gate Electrodes (2006)
    • Crystalline and electrical properties of mictamict TiSiN gate MOS capacitors (2007)
  • Furumai Kouhei ID: 9000401768378

    Articles in CiNii:1

    • 2008-04-25 (2008)
  • Furumai Kouhei ID: 9000401777984

    Articles in CiNii:1

    • 2009-04-20 (2009)
  • Furumai Kouhei ID: 9000401778104

    Articles in CiNii:1

    • 2009-04-20 (2009)
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