Search Results1-20 of  34

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  • Gonda Satoshi ID: 9000007533563

    Articles in CiNii:2

    • Accurate topographic images using a measuring atomic force microscope (2000)
    • Real-time,interferometrically measuring atomic force microscope for direct calibration of standards (2000)
  • Gonda Satoshi ID: 9000007533620

    Articles in CiNii:1

    • Mechanical performances of a symmetrical, monolithic three-dimensional fine-motion stage for nanometrology (2000)
  • GONDA Satoshi ID: 9000002045195

    National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST) (2006 from CiNii)

    Articles in CiNii:1

    • Metrology AFM and Nanometrology (2006)
  • GONDA Satoshi ID: 9000002961870

    (独)産業技術総合研究所計測標準研究部門長さ計測科幾何標準研究室 (2009 from CiNii)

    Articles in CiNii:14

    • 原点対称形の一体型三次元微動機構 (第1報)-設計・試作- (1997)
    • 原点対称形の一体型三次元微動機構(第2報)-特性評価- (1999)
    • 三次元測長型AFMによる形状パラメータの測定と不確かさ (1999)
  • GONDA Satoshi ID: 9000005526926

    National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST) (2006 from CiNii)

    Articles in CiNii:26

    • Reliability of parameters of associated base straight line in step height samples : Uncertainty evaluation in step height measurements using nanometrological AFM (2006)
    • Sub-Nanometer Scale Measurements of Silicon Oxide Thickness by Spectroscopic Ellipsometry (1999)
    • In-Situ Selective Area Etching of GaAs in Metalorganic Molecular Beam Epitaxy Chamber using Trisdimethylaminoarsenic (1996)
  • GONDA Satoshi ID: 9000016377759

    National Metrology Institute of Japan, AIST (2009 from CiNii)

    Articles in CiNii:1

    • Nanometer Scale Height Standard Using Atomically Controlled Diamond Surface (2009)
  • GONDA Satoshi ID: 9000107336175

    MIRAI, National Institute of Advanced Industrial Science and Technology (2006 from CiNii)

    Articles in CiNii:1

    • Critical-Dimension Measurement using Multi-Angle-Scanning Method in Atomic Force Microscope (2006)
  • GONDA Satoshi ID: 9000107386603

    MIRAI-National Institute of Advanced Industrial Science and Technology (AIST) (2006 from CiNii)

    Articles in CiNii:1

    • Side-Wall Measurement using Tilt-Scanning Method in Atomic Force Microscope (2006)
  • GONDA Satoshi ID: 9000253679644

    National Research Laboratory of Metrology (1999 from CiNii)

    Articles in CiNii:1

    • Analysis of Surface and Nano-Structure. Nanometrology and Standards. (1999)
  • GONDA Satoshi ID: 9000258092893

    産業技術総合研究所 (2014 from CiNii)

    Articles in CiNii:1

    • Nanoscale Standards (2014)
  • GONDA Satoshi ID: 9000258719239

    National Institute of Advanced Industrial Science and Technology (2013 from CiNii)

    Articles in CiNii:1

    • Introduction of Guidelines and Trend of ISO Standardization for Performance Testing of Industrial X-ray CT Systems used for Dimensional Measurements (2013)
  • GONDA Satoshi ID: 9000283819664

    National Institute of Advanced Industrial Science and Technology (2010 from CiNii)

    Articles in CiNii:1

    • Development of photomask linewidth standard (2010)
  • Gonda Satoshi ID: 9000025119287

    Articles in CiNii:1

    • Height Measurement Using High-Precision Atomic Force Microscope Scanner Combined with Laser Interferometers (2006)
  • Gonda Satoshi ID: 9000252975394

    Research Laboratory of Engineering Materials, Tokyo Institute of Technology (1990 from CiNii)

    Articles in CiNii:1

    • Fluorine Doping and Superconductivity of Nd<SUB>2</SUB>CuO<SUB>4</SUB> Thin Films (1990)
  • Gonda Satoshi ID: 9000252979538

    The Research Laboratory of Engineering Materials, Tokyo Institute of Technology (1991 from CiNii)

    Articles in CiNii:1

    • Heteroepitaxial Growth of CeO<SUB>2</SUB>(001) Films on Si(001) Substrates by Pulsed Laser Deposition in Ultrahigh Vacuum (1991)
  • Gonda Satoshi ID: 9000258634441

    National Institute of Advanced Industrial Science and Technology (2003 from CiNii)

    Articles in CiNii:1

    • Precision Measurements of Stepheight Standards and Measurement Uncertainty using Nanometrological AFM and Interferometric Microscope (2003)
  • Gonda Satoshi ID: 9000258639736

    National Institute of Advanced Industrial Science and Technology (2004 from CiNii)

    Articles in CiNii:1

    • Atomic Force Microscope with Symmetrical Differential Laser Interferometer (2nd report) Uncertainty estimation in pitch measurements (2004)
  • Gonda Satoshi ID: 9000258642315

    National Institute of Advanced Industrial Science and Technology (2005 from CiNii)

    Articles in CiNii:1

    • Development of Calibration Technique and Reference Materials for Nanometric scales (2005)
  • Gonda Satoshi ID: 9000258644184

    National Institute of Advanced Industrial Science and Technology (2005 from CiNii)

    Articles in CiNii:1

    • Development of Nanometric Lateral Sales (2005)
  • Gonda Satoshi ID: 9000258644192

    National Institute of Advanced Industrial Science ant Technology (2005 from CiNii)

    Articles in CiNii:1

    • Measurements and analysis of stepheight standards with DLI-AFM (2005)
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