Search Results1-20 of  20

  • Gotoh Masahide ID: 9000025052672

    Articles in CiNii:1

    • Classification of choice factor of consumer for drip coffee by structural equation modeling analysis (2012)
  • GOTOH Masahide ID: 9000000615941

    The Institute of Scientific and Industrial Research, Osaka University (2001 from CiNii)

    Articles in CiNii:1

    • STM Analysis of the SiO_2/Si(001) Interface (2001)
  • GOTOH Masahide ID: 9000003650020

    Articles in CiNii:12

    • Modified and Unified Study on Reissner's and Mindlin's Theories of Elastic Plates (2007)
    • X-ray study on Mg-Sm alloy produced by HPT (2007)
    • パルス管内部の流体の動的挙動の直接観測II : 可視化 (1995)
  • GOTOH Masahide ID: 9000005561858

    The Institute of Scientific and Industrial Research, Osaka University (2002 from CiNii)

    Articles in CiNii:3

    • Quantum Yield of Electron-Beam Induced Decomposition of SiO_2 Overlay on Si in Nanolithography Using a Scanning Tunneling Microscope (2001)
    • Electron Tunneling through SiO_2/Si Structures in Scanning Tunneling Microscopy (2001)
    • Interface Morphology of Thermal-Oxide/Si(001) Studied by Scanning Tunneling Microscopy (2002)
  • GOTOH Masahide ID: 9000017381736

    Fuji Electric Holdings Co., Ltd. (2010 from CiNii)

    Articles in CiNii:1

    • Anisotropic Transformation of 4H-SiC Etching Shapes by High Temperature Annealing (2010)
  • GOTOH Masahide ID: 9000020105183

    The Institute of Scientific and Industrial Research, Osaka University (2001 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (2001)
  • GOTOH Masahide ID: 9000020453849

    Graduate School of Nat. Sci. & Tech., Kanazawa Univ. (2010 from CiNii)

    Articles in CiNii:1

    • Microstructural Changes by Annealing and Mechanical Properties of Ultra Fine-Grained Low Carbon Steels Processed by ECAP (2010)
  • GOTOH Masahide ID: 9000021251961

    Graduate School of Natural Sci. & Tech., Univ. of Kanazawa (2009 from CiNii)

    Articles in CiNii:1

    • Fatigue Strength and X-ray Triaxial Residual Stress Measurement of Annealed Fine Grained Steels Processed by Shot Peening (2009)
  • Gotoh Masahide ID: 9000003791959

    Graduate School of Natural Science & Tech., Kanazawa Univ. (2003 from CiNii)

    Articles in CiNii:1

    • OS4(P)-8(OS04W0091) A Comparison of X-ray Stress Measurement Methods for TiN Thin Films Having Fiber Texture near Single Crystal Structure (2003)
  • Gotoh Masahide ID: 9000023967837

    Articles in CiNii:1

    • Influence of annealing on strength of ultrafine grained low carbon steels by ECAP (2010)
  • Gotoh Masahide ID: 9000023979658

    Articles in CiNii:1

    • Influence of steel grain size on residual stress in grinding processing (2010)
  • Gotoh Masahide ID: 9000053655515

    Articles in CiNii:1

    • Effect of Surface Structure on Transformation of 4H-SiC by High-Temperature Annealing (2010)
  • Gotoh Masahide ID: 9000057271842

    Articles in CiNii:1

    • Anisotropic Transformation of 4H-SiC Etching Shapes by High-Temperature Annealing and Its Enhancement by Ion Implantation (2010)
  • Gotoh Masahide ID: 9000258154434

    The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan (2001 from CiNii)

    Articles in CiNii:1

    • Quantum Yield of Electron-Beam Induced Decomposition of SiO2 Overlay on Si in Nanolithography Using a Scanning Tunneling Microscope. (2001)
  • Gotoh Masahide ID: 9000258159784

    The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki 567-0047, Japan (2002 from CiNii)

    Articles in CiNii:1

    • Interface Morphology of Thermal-Oxide/Si(001) Studied by Scanning Tunneling Microscopy. (2002)
  • Gotoh Masahide ID: 9000259835083

    National Institute of Advanced Industrial Science and Technology AIST (2014 from CiNii)

    Articles in CiNii:1

    • Novel Ion Implantation Process with High Heat Resistant Photoresist in Silicon Carbide Device Fabrication (2014)
  • Gotoh Masahide ID: 9000309162323

    Graduate school, Kanazawa University (2003 from CiNii)

    Articles in CiNii:1

    • OS04W0091 A comparison of X-ray stress measurement methods for TiN thin films having fiber texture near single crystal structure (2003)
  • Gotoh Masahide ID: 9000401700257

    Articles in CiNii:1

    • Electron Tunneling through SiO2/Si Structures in Scanning Tunneling Microscopy (2001)
  • Gotoh Masahide ID: 9000401701178

    Articles in CiNii:1

    • Quantum Yield of Electron-Beam Induced Decomposition of SiO2Overlay on Si in Nanolithography Using a Scanning Tunneling Microscope (2001)
  • Gotoh Masahide ID: 9000401711145

    Articles in CiNii:1

    • Interface Morphology of Thermal-Oxide/Si(001) Studied by Scanning Tunneling Microscopy (2002)
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