Search Results1-20 of  142

  • GOHSHI YOHICHI ID: 9000020325272

    Toshiba Research and Development Center (1972 from CiNii)

    Articles in CiNii:1

    • X-Ray Spectrochemical Analysis (1972)
  • GOHSHI YOHICHI ID: 9000253160200

    Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • ENZYMIC INVESTIGATION OF SURFACTANT MICELLES BY MEANS OF TIME RESOLVED ANALYSIS:INFLUENCE OF SURFACTANT ON THE ACTIVITY OF GLUCOSE OXIDASE (1991)
  • GOHSHI YOHICHI ID: 9000253160461

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • TRACE ELEMENT QUANTIFICATION USING SYNCHROTRON RADIATION X-RAY FLUORESCENCE ANALYSIS (1991)
  • GOHSHI YOHICHI ID: 9000253160591

    Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • SCANNING TUNNELLING MICROSCOPIC CHARACTERIZATION OF ORGANIC MOLECULES (1991)
  • GOHSHI YOHICHI ID: 9000253160610

    Department of Industrial Chemistry, Faculty of Engineering, The university of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE ANALYSIS USING SYNCHROTRON RADIATION (1991)
  • GOHSHI YOHICHI ID: 9000253161076

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • HIGH SPATIAL RESOLUTION X-RAY FLUORESCENCE IMAGING BY IMAGE RECONSTRUCTION TECHNIQUE USING SYNCHROTRON RADIATION (1991)
  • GOHSHI YOHICHI ID: 9000253161254

    Department of Industrial Chemistry, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • PROFILE CHANGES OF THE OXYGEN K X-RAY FLUORESCENCE SPECTRA OF COPPER COMPOUNDS INCLUDING HIGH Tc SUPERCONDUCTORS (1991)
  • GOHSHI Yohichi ID: 9000000086488

    Department of Applied Chemistry Faculty of Engineering The University of Tokyo (1995 from CiNii)

    Articles in CiNii:1

    • Preface (1995)
  • GOHSHI Yohichi ID: 9000000089648

    Course of Applied Chemistry, Graduate School of Engineering, The University of Tokyo (1997 from CiNii)

    Articles in CiNii:1

    • Investigation of Molybdenum Disulphide Using a Scanning Tunneling Microscope under Irradiation of Monochromated UV-VIS (1997)
  • GOHSHI Yohichi ID: 9000000089949

    Department of Applied Chemistry, School of Engineering, University of Tokyo (1997 from CiNii)

    Articles in CiNii:1

    • A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle (1997)
  • GOHSHI Yohichi ID: 9000000089953

    Department of Applied Chemistry, School of Engineering, University of Tokyo (1997 from CiNii)

    Articles in CiNii:1

    • Chemical State Observation of Ni Adsorbad on Zeolite by the Conversion-Electron-Yield Method (1997)
  • GOHSHI Yohichi ID: 9000002957262

    東京大学工学部 (1994 from CiNii)

    Articles in CiNii:3

    • 基礎研究と分析化学 (1993)
    • 転換期としての20周年 (1994)
    • V.先端材料のキャラクタリゼィション(第115回講演大会討論会報告) (1988)
  • GOHSHI Yohichi ID: 9000003287051

    National Institute for Environmental Studies (2000 from CiNii)

    Articles in CiNii:22

    • X-Ray Absorption and Photoelectron Spectroscopies Using Total Reflection X-Rays (1995)
    • Inelastic Mean Free Path of Photoelectrons in Ag Determined by Total Reflection X-Ray Photoelectron Spectroscopy (1997)
    • Effect of The Boundary of the Interface on the Oscillation Mode in the Three-Phases Liquid Membrane System (1998)
  • GOHSHI Yohichi ID: 9000004506801

    Department of Applied Chemistry, Faculty of Engineering, University of Tokyo:(Present) National Institute for Environmental Studies (1998 from CiNii)

    Articles in CiNii:2

    • 光散乱によるセラミックス材料の解析 (1993)
    • Quantitative examinations of the near-infrared FT-surface enhanced Raman scattering intensity of sample adsorbed on Au colloid (1998)
  • GOHSHI Yohichi ID: 9000004507286

    国立環境研究所 (2006 from CiNii)

    Articles in CiNii:9

    • 横から見たリモートセンシング (2002)
    • はじめに (1999)
    • Standardization of Total Reflection X-ray Fluorescence Analysis (2003)
  • GOHSHI Yohichi ID: 9000005598512

    Department of Applied Chemistry, School of Engineering, The University of Tokyo (1999 from CiNii)

    Articles in CiNii:1

    • Electron Spectroscopy Using a Gas-Flow Proportional Counter under Gaseous Environment and its Application to X-Ray absorption fine structure Measurements (1999)
  • GOHSHI Yohichi ID: 9000005715726

    Faculry of Engineering, University of Tokyo (1994 from CiNii)

    Articles in CiNii:1

    • Cu 2p Photoelectron and 2p_<3/2>-Valence-Valence Auger Electron Spectra of Cuprate Superconductors (1994)
  • GOHSHI Yohichi ID: 9000005751768

    Institute of Industrial Science, University of Tokyo (1978 from CiNii)

    Articles in CiNii:2

    • Angular Denendence of XPS Intensities from GaAs (110) Surface : PHOTOEMISSION (MAINLY UPS AND XPS) (1978)
    • Chemical State Analysis of Silicon-Oxygen Compounds : CHEMICAL APPLICATIONS (1978)
  • GOHSHI Yohichi ID: 9000005751928

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1978 from CiNii)

    Articles in CiNii:1

    • Data Processing in High Resolution X-Ray Spectroscopy : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION (1978)
  • GOHSHI Yohichi ID: 9000018264734

    Articles in CiNii:2

    • 研究の新潮流を (1997)
    • 分析化学から分析科学へ : 第1部 (2010)
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