Search Results81-100 of  142

  • Gohshi Yohichi ID: 9000252958522

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1986 from CiNii)

    Articles in CiNii:1

    • X-Ray Fluorescence Analysis of Hg in SiO<SUB>2</SUB> Films Deposited by Hg-Sensitized Photo-CVD (1986)
  • Gohshi Yohichi ID: 9000252959874

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1987 from CiNii)

    Articles in CiNii:1

    • Characterization of Co–O Thin Films by X-Ray Fluorescence Using Chemical Shifts of Absorption Edges (1987)
  • Gohshi Yohichi ID: 9000252965310

    Department of Industrial Chemistry, University of Tokyo (1988 from CiNii)

    Articles in CiNii:1

    • Analysis of Contamination Layer of InP During LPE Process by Synchrotron Radiation-Excited X-Ray Fluorescence (1988)
  • Gohshi Yohichi ID: 9000252967098

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1988 from CiNii)

    Articles in CiNii:1

    • Laser Breakdown Acoustic Effect of Ultrafine Particle in Liquids and Its Application to Particle Counting (1988)
  • Gohshi Yohichi ID: 9000253116127

    Toshiba Research and Development Center (1975 from CiNii)

    Articles in CiNii:1

    • Fluorescent X-ray K.BETA. shift and magnetic moment of Mn2+ ion in ordered perovskites (BaLa) (MnMo)O6, (SrLa) (MnTa)O6 and Ba3 (MnTa2)O9. (1975)
  • Gohshi Yohichi ID: 9000253131476

    Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo (1986 from CiNii)

    Articles in CiNii:1

    • Synthesis of optically active diamino-diimine macrocycle (6S,15S)-1,5,10,14-tetraaza-4,13-dimethyl-tricyclo(13.3.1.16,10)icosa-4,13-diene and molecular structure of its nickel(II) complex. (1986)
  • Gohshi Yohichi ID: 9000253156941

    Department of applied chemistry, The University of Tokyo (1997 from CiNii)

    Articles in CiNii:1

    • Development of a High Mass-Resolution TOF-ERDA System for a Wide Mass Range from Hydrogen to Middle Heavy Elements. (1997)
  • Gohshi Yohichi ID: 9000253160561

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1991 from CiNii)

    Articles in CiNii:1

    • A NOVEL CHARACTERIZATION TECHNIQUE FOR HIGHLY SCATTERING SAMPLES IN FOURIER TRANSFORM INFRARED SPECTROMETRY (1991)
  • Gohshi Yohichi ID: 9000253647515

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1980 from CiNii)

    Articles in CiNii:1

    • Measurement of Interface Phenomena by the Photoacoustic Method (1980)
  • Gohshi Yohichi ID: 9000254128627

    Toshiba Research and Development Center (1976 from CiNii)

    Articles in CiNii:1

    • Sulfur <I>K</I>β X-Ray Emission Bands and Valence-Band Structures of Transition-Metal Disulfides (1976)
  • Gohshi Yohichi ID: 9000254890430

    Toshiba Research and Development Center Kawasaki (1973 from CiNii)

    Articles in CiNii:1

    • Chemical State Analysis of Sulfur in Coal by High Resolution Fluorescent x-Ray Spectrometry (1973)
  • Gohshi Yohichi ID: 9000256016632

    Department of Applied Chemistry, School of Engineering, The University of Tokyo (1998 from CiNii)

    Articles in CiNii:1

    • Spectro-Diffractometry for Chemical-State Analysis Based on In-Advance Simulations. (1998)
  • Gohshi Yohichi ID: 9000256655999

    Faculty of Eng., The Univ. of Tokyo (1985 from CiNii)

    Articles in CiNii:1

    • Trace element determination by X-ray fluorescence analysis. (1985)
  • Gohshi Yohichi ID: 9000256658197

    Depertment of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1994 from CiNii)

    Articles in CiNii:1

    • Lower Limit of Quantification iwht X-ray Fluorescence Analysis. (1994)
  • Gohshi Yohichi ID: 9000256679395

    Industrial Chemistry, Faculty of Engineering, University of Tokyo (1989 from CiNii)

    Articles in CiNii:1

    • New Characterization Technique for Pitches by FT-IR Spectroscopy (1989)
  • Gohshi Yohichi ID: 9000257712117

    Department of Applied Chemistry, School of Engineering, The University of Tokyo (1998 from CiNii)

    Articles in CiNii:1

    • In-Advance Simulation and Chemical State Analysis by Spectro-Diffractometry. (1998)
  • Gohshi Yohichi ID: 9000258120059

    Department of Applied Chemistry, Faculty of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo 113 (1994 from CiNii)

    Articles in CiNii:1

    • Tunnel Gap Imaging Study of Highly Oriented Pyrolytic Graphite Using Scanning Tunneling Microscope. (1994)
  • Gohshi Yohichi ID: 9000258120228

    Faculry of Engineering, Universiry of Tokyo, Hongo, Bunkyo, Tokyo 113 (1994 from CiNii)

    Articles in CiNii:1

    • Cu 2p Photoelectron and 2p3/2-Valence-Valence Auger Electron Spectra of Cuprate Superconductors. (1994)
  • Gohshi Yohichi ID: 9000258126769

    Department of Applied Chemistry, Faculty of Engineering, The University of Tokyo, 7–3–1 Hongo, Bunkyo–ku, Tokyo 113, Japan (1995 from CiNii)

    Articles in CiNii:1

    • High-Performance Current-Voltage Measurement System for Scanning Tunneling Spectroscopy of Deposited Molecules. (1995)
  • Gohshi Yohichi ID: 9000258128449

    Department of Applied Chemistry, Faculty of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo 113, Japan (1995 from CiNii)

    Articles in CiNii:1

    • Tunnel Gap Imaging Investigation of Voltage Dependence of Molecular Images Obtained by Scanning Tunneling Microscope. (1995)
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