Search Results1-4 of  4

  • HACHIYA Koutaro ID: 9000004878062

    Jedat Inc. (2010 from CiNii)

    Articles in CiNii:6

    • Impact of Self-Heating in Wire Interconnection on Timing (2010)
    • An Approach for Reducing Leakage Current Variation due to Manufacturing Variability (2009)
    • Fast On-Chip Inductance Extraction of VLSI Including Angled Interconnects (2003)
  • HACHIYA Koutaro ID: 9000004954752

    Articles in CiNii:6

    • Cenju-3上での並列回路シミュレ-ションの評価 (並列マシンCenju-3小特集) (1995)
    • A method to estimate clock jitter due to power supply noise (2006)
    • Interconnect Simulation (2003)
  • HACHIYA Koutaro ID: 9000016259947

    NEC Electronics Corp. (2007 from CiNii)

    Articles in CiNii:1

    • Fast Methods to Estimate Clock Jitter due to Power Supply Noise (2007)
  • HACHIYA Koutaro ID: 9000404507614

    NEC Electronics Corp. (2003 from CiNii)

    Articles in CiNii:1

    • Interconnect simulation (2003)
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