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  • HAMAMURA Yuichi ID: 9000017683966

    Production Engineering Research Laboratory, Hitachi, Ltd. (2011 from CiNii)

    Articles in CiNii:2

    • Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing (2009)
    • A New Critical Area Simulation Algorithm and Its Application for Failing Bit Analysis (2011)
  • HAMAMURA Yuichi ID: 9000259338241

    the Yokohama Research Laboratory, Hitachi, Ltd. (2013 from CiNii)

    Articles in CiNii:1

    • Novel Fuse Scheme with a Short Repair Time to Maximize Good Chips per Wafer in Advanced SoCs (2013)
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