Search Results1-20 of  82

  • 1 / 5
  • Hata Nobuhiro ID: 9000025063540

    Articles in CiNii:1

    • Young's modulus enhancement of mesoporous pure-silica-zeolite low-dielectric-constant films by ultraviolet and silylation treatments (2009)
  • HATA Nobuhiro ID: 9000000247538

    Articles in CiNii:4

    • 基礎講座 (1998)
    • 基礎講座 (1998)
    • 基礎講座 (1998)
  • HATA Nobuhiro ID: 9000000932453

    Articles in CiNii:12

    • 味覚検査に関する検討 : 自発性異常味覚と解離性味覚障害について (2002)
    • 顎矯正術後患者における栄養アセスメント蛋白による栄養管理の試み (2003)
    • 味覚異常と血清亜鉛および血清銅の関連 (2003)
  • HATA Nobuhiro ID: 9000001127431

    Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST) (2008 from CiNii)

    Articles in CiNii:15

    • Theoretical Analysis of Elastic Modulus and Dielectric Constant for Low-k Two-Dimensional Periodic Porous Silica Films (2004)
    • Mechanical Property Determination of Thin Porous Low-k Films by Twin-Transducer Laser Generated Surface Acoustic Waves (2004)
    • Microstructure Characterization of Skeletal Silica in Porous Low-k Films by Infrared Spectroscopic Ellipsometry (2004)
  • HATA Nobuhiro ID: 9000003592338

    Department of Neurosurgery, Clinical Research Institute, National Kyushu Medical Center Hospital:(Present address)Department of Neurosurgery, Graduate School of Medical Sciences, Kyushu University (2003 from CiNii)

    Articles in CiNii:1

    • Ectopic Pituitary Adenoma in the Cavernous Sinus Causing Oculomotor Nerve Paresis : Case Report (2003)
  • HATA Nobuhiro ID: 9000004964794

    National Institute of Advanced Industrial Science and Technology (AIST) (2008 from CiNii)

    Articles in CiNii:3

    • Development of Mesoporous Silica Films for Ultra Low-k Interlayer Dielectrics (2005)
    • Novel Self-Assembled Ultra-Low-k Porous Silica Films with High Mechanical Strength for 45nm BEOL Technology (2004)
    • 32nm node Ultralow-k(k=2.1)/Cu Damascene Multilevel Interconnect using High-Porosity (50%) High-Modulus (9GPa) Self-Assembled Porous Silica (2008)
  • HATA Nobuhiro ID: 9000005550817

    Electrotechnical Laboratory (1995 from CiNii)

    Articles in CiNii:5

    • Annearling Energy Distribution of Light-Induced Defects of Hydrogeneted Amorphous Silicon Films Grown from Silane and Dichlorosilane Gas Mixtures (1995)
    • Plasma Enhanced Chemical Vapour Deposition of Hydrogenated Amorphous Silicon from Dichlorosilane and Silane Gas Mixtures (1995)
    • Comparison of Defect Annealing Kinetics of a-Si:H Prepared by Pure Silane and Helium Diluted Silane by Triode Plasma Chemical Vapour Deposition (1994)
  • HATA Nobuhiro ID: 9000018707245

    Department of Neurosurgery, Hachisuga Hospital (2011 from CiNii)

    Articles in CiNii:1

    • Foreign Body Granuloma Associated With Dura-Cranioplasty After Resection of Convexity Meningioma With Extracranial Extension : Case Report (2011)
  • HATA Nobuhiro ID: 9000019241623

    Department of Neurosurgery, Graduate School of Medical Sciences, Kyushu University (2012 from CiNii)

    Articles in CiNii:1

    • Relationship between MR Findings and Genetic Alterations in Glioblastomas (2012)
  • HATA Nobuhiro ID: 9000020268056

    電子技術総合研究所 (1989 from CiNii)

    Articles in CiNii:1

    • Vacuum technology lecture. For ultra-high vacuum technology. 14. Light application technology. 2. Process technology using light. (1). Measurement and diagnosis technology using light. (2). (1989)
  • HATA Nobuhiro ID: 9000020324009

    Electrotechnical Laboratory (1988 from CiNii)

    Articles in CiNii:1

    • Process diagnostics through measurement of neutral molecules in low-temperature plasmas.:Temperature Plasmas (1988)
  • HATA Nobuhiro ID: 9000020327046

    Electrotechnical Laboratory (1984 from CiNii)

    Articles in CiNii:1

    • Optical Diagnostic Techniques of Low-Pressure Gas Discharges (1984)
  • HATA Nobuhiro ID: 9000020775896

    Electrotechnical Laboratory (1985 from CiNii)

    Articles in CiNii:1

    • CARS as a diagnostic tool of CVD plasmas. (1985)
  • HATA Nobuhiro ID: 9000107306314

    MIRAI, Project, Advanced Semiconductor Research Center (ASRC) (2003 from CiNii)

    Articles in CiNii:1

    • Effects of Surfactants on the Properties of Ordered Periodic Porous Silica Films (2003)
  • HATA Nobuhiro ID: 9000107307622

    MIRAI-ASRC, AIST (2004 from CiNii)

    Articles in CiNii:1

    • Control of Pore Structures in Periodic Porous Silica Low-k Films (2004)
  • HATA Nobuhiro ID: 9000107307662

    MIRAI-ASRC, AIST (2004 from CiNii)

    Articles in CiNii:1

    • Nondestructive Characterization of a Series of Periodic Porous Silica Films by in situ Spectroscopic Ellipsometry in a Vapor Cell (2004)
  • HATA Nobuhiro ID: 9000107338579

    MIRAI, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST) (2004 from CiNii)

    Articles in CiNii:1

    • Molecular Orbital Calculation of the Elastic Modulus and the Dielectric Constant for Ultra Low-k Organic Polymers (2004)
  • HATA Nobuhiro ID: 9000107346190

    MIRAI, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST) (2004 from CiNii)

    Articles in CiNii:1

    • Transient Capacitance Spectroscopy of Copper-Ion-Drifted Methylsilsesquiazane-Methylsilsesquioxane Interlayer Dielectrics (2004)
  • HATA Nobuhiro ID: 9000107389367

    MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (2004 from CiNii)

    Articles in CiNii:1

    • Mechanical Property and Network Structure of Porous Silica Films (2004)
  • HATA Nobuhiro ID: 9000107391888

    MIRAI, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST) (2005 from CiNii)

    Articles in CiNii:1

    • Theoretical Investigation of Dielectric Constant and Elastic Modulus of Two-Dimensional Periodic Porous Silica Films with Elliptical Cylindrical Pores (2005)
  • 1 / 5
Page Top