Search Results1-11 of  11

  • HATSUDA Tsuguyasu ID: 9000002015358

    Matsushita Electric Industrial Co., Ltd. System LSI Technology Development Center Corporate System LSI Division, Semiconductor Company (2007 from CiNii)

    Articles in CiNii:1

    • Challenges and Prospects of Low Power System-on-a-Chip for Digital Consumer Electronics (2007)
  • HATSUDA Tsuguyasu ID: 9000004916880

    Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • Gate Level Layout Paramater Extraction Method for Large Scale Circuit (1997)
  • HATSUDA Tsuguyasu ID: 9000005754643

    Department of Electrical Engineering, Faculty of Technology Kanazawa University (1985 from CiNii)

    Articles in CiNii:1

    • Observation of Surface Roughness by PAS using Transparent Transducer and Photothermal Deflection Spectroscopy (PDS) : Photoacoustic Spectroscopy (1985)
  • HATSUDA Tsuguyasu ID: 9000005755374

    Department of Electrical and Computer Engineering, Faculty of Technology, Kanazawa University (1986 from CiNii)

    Articles in CiNii:1

    • Evaluation of Optical Absorption Coefficients of a-SiN:H Films by Photothermal Deflection Spectroscopy(PDS) : Photoacoustic Spectroscopy (1986)
  • Hatsuda Tsuguyasu ID: 9000252955886

    Department of Electrical Engineering, Faculty of Technology, Kanazawa University (1985 from CiNii)

    Articles in CiNii:1

    • Evaluation of Si Thin Films by Photothermal Deflection Spectroscopy (PDS) (1985)
  • Hatsuda Tsuguyasu ID: 9000392700615

    Articles in CiNii:1

    • Evaluation of Si Thin Films by Photothermal Deflection Spectroscopy (PDS) (1985)
  • Hatsuda Tsuguyasu ID: 9000398979534

    Articles in CiNii:1

    • P-30 Evaluation of Optical Absorption Coefficients of Si Thin Films by Photothermal Deflection Spectroscopy (PDS) (1985)
  • Hatsuda Tsuguyasu ID: 9000401596956

    Articles in CiNii:1

    • Evaluation of Si Thin Films by Photothermal Deflection Spectroscopy (PDS) (1985)
  • Hatsuda Tsuguyasu ID: 9000401977906

    Articles in CiNii:1

    • Effects of post-deposition annealing in O2 on threshold voltage of Al2O3/AlGaN/GaN MOS heterojunction field-effect transistors (2019)
  • Hatsuda Tsuguyasu ID: 9000402057781

    Articles in CiNii:1

    • Observation of Surface Roughness by PAS using Transparent Transducer and Photothermal Deflection Sepectroscopy (PDS) (1985)
  • Hatsuda Tsuguyasu ID: 9000402059475

    Articles in CiNii:1

    • Evaluation of Optical Absorption Coefficients of a-SiN:H Films by Photothermal Deflection Spectroscopy (PDS) (1986)
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