Search Results1-20 of  113

  • Hatsuzawa Takeshi ID: 9000007532647

    Articles in CiNii:1

    • Optimization of Fringe Spacing in a Digital Flatness Test (1987)
  • Hatsuzawa Takeshi ID: 9000007532694

    Articles in CiNii:4

    • Speed Control Characteristics and Digital Servosystem of a Circular Traveling Wave Motor (1987)
    • Development of an Attitude Control Device for a Small Specimen in an SEM (1989)
    • A Metrological Electron Microscope System for Microfeatures of Very Large Scale Integrated Circuits (1990)
  • Hatsuzawa Takeshi ID: 9000007532705

    Articles in CiNii:1

    • Piezodriven Spindle for a Specimen Holder in the Vacuum Chamber of a Scanning Electron Microscope (1987)
  • Hatsuzawa Takeshi ID: 9000007532782

    Articles in CiNii:1

    • Automatic Centring System for a Roundness Tester using Force Feedback Techniques (1988)
  • Hatsuzawa Takeshi ID: 9000007532799

    Articles in CiNii:1

    • Small Step Height Calibrated by Laser/Stylus Sensing Device (1988)
  • HATSUZAWA TAKESHI ID: 9000283809985

    東京工業大学 精密工学研究所 (2006 from CiNii)

    Articles in CiNii:1

    • Development of Belt Type High–Speed Crystal Blank Polish System (2006)
  • HATSUZAWA Takeshi ID: 1000070272721

    Tokyo Institute of Technology (2010 from CiNii)

    Articles in CiNii:68

    • Precision Measurements of Electron Beam diameters by Using a Micro-Laser Interferometer (1996)
    • A Tapping Stylus for Surface Topographical Measurements Using a Quartz Fork of Watch (1998)
    • A Surface Roughness Reference Fabricated by Using an Anisotoropic Etching of Silicon Crystal (1998)
  • HATSUZAWA Takeshi ID: 9000001881517

    Precision and Intelligence Laboratory, Tokyo Institute of Technology (2007 from CiNii)

    Articles in CiNii:2

    • High Speed Surface Micro-Polishing for Spurious Reduction of Small Quartz Crystal Blanks (2007)
    • On-Chip Single-Cell Lysis for Extracting Intracellular Material (2007)
  • HATSUZAWA Takeshi ID: 9000002115146

    Precision and Intelligence Laboratory, Tokyo Institute of Technology (2008 from CiNii)

    Articles in CiNii:1

    • Fabrication of DEP Device for Cell Positioning and its Cell Viability Test (2008)
  • HATSUZAWA Takeshi ID: 9000002961866

    東京工業大学大学院理工学研究科 (2002 from CiNii)

    Articles in CiNii:1

    • Measurements in Nanometer Scale : Difficulties in the Technology (2002)
  • HATSUZAWA Takeshi ID: 9000017587821

    Articles in CiNii:1

    • Surface Topographic Measurement Using Piezo-Electrical PVDF Film Stylus (2003)
  • HATSUZAWA Takeshi ID: 9000018264285

    P & I Lab, Tokyo Inst. of Tech (2000 from CiNii)

    Articles in CiNii:2

    • A Study on Tapping Styluses for Surface Profilometry (2000)
    • タッピングスタイラス用片持ちはりの動特性解析 (2000)
  • HATSUZAWA Takeshi ID: 9000019971979

    Articles in CiNii:1

    • SPM:—viewed from a precision engineering standpoint— (2009)
  • HATSUZAWA Takeshi ID: 9000020672627

    Articles in CiNii:1

    • Edge deformation in micropattern line-width measurements. (1988)
  • HATSUZAWA Takeshi ID: 9000020679286

    Tokyo Institute of Technology (2010 from CiNii)

    Articles in CiNii:1

    • Attitude Control of Nanosatellites by Paddle Motion Using Elastic Hinges Actuated by Shape Memory Alloy (2010)
  • HATSUZAWA Takeshi ID: 9000022014324

    Department of Mechano-Micro Engineering, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology (2008 from CiNii)

    Articles in CiNii:1

    • Evaluation of Cell Adhesion Characteristics on the Porous Silicon Substrates with Various Surface Structures (2008)
  • HATSUZAWA Takeshi ID: 9000243892214

    東京工業大学 精密工学研究所 (2014 from CiNii)

    Articles in CiNii:1

    • Bio-device Fabrication by Precision Engineering (2014)
  • HATSUZAWA Takeshi ID: 9000254282442

    National Research Laboratory of Metrology (1993 from CiNii)

    Articles in CiNii:1

    • An Estimation of Secondary Electron Intensity Signal at Edges by Using Cylindrical Projection Model (1993)
  • HATSUZAWA Takeshi ID: 9000254283377

    Tokyo Institute of Thechnology, Precision and Intelligence Laboratory (1996 from CiNii)

    Articles in CiNii:1

    • Precision Measurements of Electron Beam diameters by Using a Micro-Laser Interferometer (1996)
  • HATSUZAWA Takeshi ID: 9000254283478

    Tokyo Institute of Technology, Precision and Intelligence Laboratory (1997 from CiNii)

    Articles in CiNii:1

    • Inspection of TAB Lead Defects by a Spatial Filtering (1997)
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