Search Results1-20 of  206

  • Hattori Takeo ID: 9000009496305

    Articles in CiNii:1

    • Pulsed Neutron Diffraction and X-ray Diffraction Study on the Short Range Structure of Na2O-TeO2 Glasses and Melts (Proceedings of the 1st International Symposium on Advanced Science Research(ASR-2000), Advances in Neutron Scattering Research) (2001)
  • HATTORI TAKEO ID: 9000001557302

    Chiba University (1996 from CiNii)

    Articles in CiNii:1

    • Preparation and Electrical Properties of Zn-Al-O Materials by Ultrasonic Spray-Drying (1996)
  • HATTORI TAKEO ID: 9000001557305

    Chiba University (1996 from CiNii)

    Articles in CiNii:1

    • Thermal Expansion of Lithium Aluminum Silicate Materials Prepared by Sol-Gel Process (1996)
  • HATTORI Takeo ID: 1000080009539

    Department of Materials Technology, Faculty of Engineering, Chiba University (2004 from CiNii)

    Articles in CiNii:19

    • X-Ray Diffraction Study on Microstructure of Li_2O-TeO_2 Glasses (1998)
    • "Fundamental Reaction of Refractories" Thermal Decomposition of Solids (1997)
    • Preparation of Zn-Al-0 System Materials by Ultrasonic Spray-drying Method and its Electrical Properties. (1996)
  • HATTORI Takeo ID: 9000000138788

    千葉大学教授工学部機能材料工学科 (1997 from CiNii)

    Articles in CiNii:1

    • At Ending My Term of General Editor of "TAIKABUTSU" (1997)
  • HATTORI Takeo ID: 9000001037381

    Musashi Institute of Technology (2004 from CiNii)

    Articles in CiNii:2

    • Enhancement of Strain Relaxation of SiGe Thin Layers by Pre-Ion-Implantation into Si Substrates (2003)
    • Strain Relaxation and Induced Defects in SiGe Thin Films Grown on Ion-Implanted Si Substrates (2004)
  • HATTORI Takeo ID: 9000001717554

    Department of Electrical and Electronic Engineering, Musashi Institute of Technology (1997 from CiNii)

    Articles in CiNii:1

    • Surface and Interface Structures of Ultra-Thin Thermal Oxides on Si(100) (1997)
  • HATTORI Takeo ID: 9000003241425

    Laboratory RCA, Inc. (1965 from CiNii)

    Articles in CiNii:1

    • The Effect of Self-magnetic Field on the Galvanomagnetic Effects in Bismuth (1965)
  • HATTORI Takeo ID: 9000003244016

    Laboratories RCA, Inc. (1967 from CiNii)

    Articles in CiNii:1

    • "Diffusion Size Effect" in Bismuth at Liquid Helium Temperatures (1967)
  • HATTORI Takeo ID: 9000003283457

    RCA Research Laboratories, Inc.P.O. (1970 from CiNii)

    Articles in CiNii:1

    • Hot electrons and impact ionization in Bi88Sb12 (1970)
  • HATTORI Takeo ID: 9000003340405

    Laboratories RCA, Inc. C. P. O. (1962 from CiNii)

    Articles in CiNii:1

    • Generation of Sound Waves by a Self-Pinched Plasma in a Solid (1962)
  • HATTORI Takeo ID: 9000003342136

    Laboratories RCA, Inc. (1968 from CiNii)

    Articles in CiNii:1

    • A transverse voltage in a longitudinal megnetic field in dismuth (1968)
  • HATTORI Takeo ID: 9000005566328

    Department of Electrical and Electronic Engineering, Musashi Institute of Technology (1995 from CiNii)

    Articles in CiNii:1

    • Effects of Light Pulse Duration on Excimer-Laser Crystallization Characteristics of Silicon Thin Films (1995)
  • HATTORI Takeo ID: 9000005654108

    Department of Electrical and Electronic Engineering, Musashi Institute of Technology (1994 from CiNii)

    Articles in CiNii:1

    • Periodic Changes in SiO_2/Si(111) Interface Structures with Progress of Thermal Oxidation (1994)
  • HATTORI Takeo ID: 9000005716161

    Institute of Applied Physics, University of Tsukuba (2001 from CiNii)

    Articles in CiNii:9

    • Atomic Scale Oxidation Process on Hydrogen-Terminated Silicon Surface (1996)
    • Molecular Orientation and Photochemical Reaction of Organoaluminum Compounds Investigated by Buried Metal Layer Infrared Reflection Absorption Spectroscopy (1994)
    • Initial Stage of Oxidation of Hydrogen-Terminated Si (100) -2×1 Surface (1995)
  • HATTORI Takeo ID: 9000006485775

    Department of Electrical and Electronic Engineering (2001 from CiNii)

    Articles in CiNii:1

    • Interface Roughness Produced by Nitrogen Atom Incorporation at a SiO_2/Si(100) Interface (2001)
  • HATTORI Takeo ID: 9000015734526

    Department of Electrical and Electronic Engineering, Musashi Institute of Technology (2003 from CiNii)

    Articles in CiNii:1

    • Pulsed-Source MOCVD of High-k Dielectric Thin Films with in situ Monitoring by Spectroscopic Ellipsometry (2003)
  • HATTORI Takeo ID: 9000020159981

    Articles in CiNii:1

    • Effect of Neutron Irradiation on the Sintering Processes of BeO Powder Compacts Containing Very Small Amount of <sup>235</sup>UO<sub>2</sub> (1974)
  • HATTORI Takeo ID: 9000020186358

    Articles in CiNii:1

    • Hot Isostatic Processing of Spinel Ceramics Prepared from the Powder by Freeze-Dried Method (1982)
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