Search Results1-12 of  12

  • HAYASHI Terumine ID: 9000004348963

    Hitachi Research Laboratory, Hitachi Ltd. (1992 from CiNii)

    Articles in CiNii:13

    • Sequential Circuit Test Generation by Real Number Simulation (1992)
    • An Automatic Design Method for Easily Testable LSI Logic Circuits (1986)
    • A Delay Test Generator for Logic LSIs (1986)
  • HAYASHI Terumine ID: 9000004869509

    the Department of Electrical and Electronic Engineering, Faculty of Engineering, Mie University (1998 from CiNii)

    Articles in CiNii:1

    • An Iterative Improvement Method for Generating Compact Tests for IDDQ Testing of Bridging Faults (1998)
  • Hayashi Terumine ID: 9000002244030

    Mie University (2007 from CiNii)

    Articles in CiNii:60

    • A Collaborative Learning System for Problem Creating, Mutual Annotation and Mutual Judgment (2002)
    • A Method of Grasping Difficult Points to Understand in Realtime (2002)
    • A method of grasping difficult points to understand in realtime (2002)
  • Hayashi Terumine ID: 9000022896527

    Articles in CiNii:1

    • A Clock Partitioning Method Using Initialization Complexity for Sequential Testability (1998)
  • Hayashi Terumine ID: 9000258698662

    The graduate school of engineering, Mie university (2008 from CiNii)

    Articles in CiNii:1

    • Influence of the discrete time computation in SpikeProp (2008)
  • Hayashi Terumine ID: 9000258698843

    The graduate school of engineering, Mie university (2008 from CiNii)

    Articles in CiNii:1

    • Assist Teachers with Immediate Comment from Descriptive Answers using SOM (2008)
  • Hayashi Terumine ID: 9000273011825

    三重大学 工学部電気電子工学科教授 (2004 from CiNii)

    Articles in CiNii:1

    • A Practical Method of Multiple−Choice Questions in Formative Tests (2004)
  • Hayashi Terumine ID: 9000273011954

    三重大学大学院 工学研究科 (2007 from CiNii)

    Articles in CiNii:1

    • Extracting features from answers of quizzes for automatic classification (2007)
  • Hayashi Terumine ID: 9000283913096

    三重大学 工学部電気電子工学科教授 (2002 from CiNii)

    Articles in CiNii:1

    • A Practice System of Choosing a Proper Answer Step for Encouraging Self-Feedback in Learners (2002)
  • Hayashi Terumine ID: 9000283913102

    三重大学 工学部電気電子工学科教授 (2002 from CiNii)

    Articles in CiNii:1

    • A Method of Classifying Description Answers of Mass Lecture in Realtime (2002)
  • Hayashi Terumine ID: 9000391541196

    Hitachi Ltd. (1987 from CiNii)

    Articles in CiNii:1

    • An Automatic Test Circuitry and Test Pattern Generation Method for ASIC (1987)
  • hayashi Terumine ID: 9000283913063

    三重大学 工学部電気電子工学科教授 (2001 from CiNii)

    Articles in CiNii:1

    • Web-Based Question and Answer System for Smooth Communication (2001)
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