Search Results1-20 of  33

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  • Hiramatsu Takahiro ID: 9000025020074

    Articles in CiNii:1

    • Positive bias instability of bottom-gate zinc oxide thin-film transistors with a SiOx/SiNx-stacked gate insulator (Special issue: Active-matrix flatpanel displays and devices: TFT technologies and FPD materials) (2011)
  • Hiramatsu Takahiro ID: 9000025119962

    Articles in CiNii:1

    • Effect of pulsed substrate bias on film properties of SiO2 deposited by inductively coupled plasma chemical vapor deposition (Special issue: Active-matrix flatpanel displays and devices: TFT technologies and FPD materials) (2010)
  • Hiramatsu Takahiro ID: 9000025120352

    Articles in CiNii:1

    • Photo-leakage current of zinc oxide thin-film transistors (Special issue: Active-matrix flatpanel displays and devices: TFT technologies and FPD materials) (2010)
  • HIRAMATSU Takahiro ID: 9000005002891

    Information Technology R&D Center, Mitsubishi Electric Corporation (2012 from CiNii)

    Articles in CiNii:8

    • A Study on Mapping MPEG2 TS into DS3 Interfaces : No.2 (1999)
    • Development of DS3 Framer/Deframer (1999)
    • 11-2 EPG/Data broadcasting real-time monitoring system (2001)
  • HIRAMATSU Takahiro ID: 9000107313812

    Kochi Casio Co., Ltd. (2007 from CiNii)

    Articles in CiNii:1

    • SiO_2 Insulator Film Synthesized at 100℃ Using Tetramethylsilane by Inductively Coupled Plasma Chemical Vapor Deposition (2007)
  • HIRAMATSU Takahiro ID: 9000345265321

    Graduate School of Engineering, Mie University (2006 from CiNii)

    Articles in CiNii:6

    • Four-Pixel accuracy Motion Estimation Unit using Multiple Extended Templates for HDTV Encoding (2005)
    • Four-Pixel accuracy Motion Estimation Unit using Multiple Extended Templates for HDTV Encoding (2006)
    • Four-Pixel accuracy Motion Estimation Unit using Multiple Extended Templates for HDTV Encoding (2005)
  • HIRAMATSU Takahiro ID: 9000365013942

    Asia Air Survey Co., Ltd. (2006 from CiNii)

    Articles in CiNii:7

    • Paleoseismicity of the Gero fault of the Atera Fault System (2002)
    • Paleoseismicity of the Gero fault constituting the horth-central part of the Atera Fault System (2003)
    • Experimental study of flood hazard map in Hat Yai lowland, Thailand (2004)
  • HIRAMATSU Takahiro ID: 9000365014376

    Asia Air Survey Co. Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • 18. Research on the Flood and Micro Landforms of Hat Yai Plain, Southern Thailand with SRTM Data and GIS(Abstracts of Papers Presented at the Fall Meeting of the Union, December 2004) : (2005)
  • HIRAMATSU Takahiro ID: 9000402076946

    Nagoya Institute of Technology (2018 from CiNii)

    Articles in CiNii:1

    • On the Nut Dilation in Tightening Process (2018)
  • Hiramatsu Takahiro ID: 9000004913334

    Mitsubishi Electric Corp. (1998 from CiNii)

    Articles in CiNii:3

    • A Speaker Verification Method using CELP Parameter (1996)
    • Text-Indicated Speaker Verification Method Using PSI-CELP Parameters (1998)
    • A Study on Speaker Verification Method Based on CELP Coding (1996)
  • Hiramatsu Takahiro ID: 9000020987941

    Asia Air Survey Co., Ltd (2007 from CiNii)

    Articles in CiNii:1

    • Holocene faulting on the Yugamine fault of the Atera fault zone, central Japan (2007)
  • Hiramatsu Takahiro ID: 9000023366209

    Articles in CiNii:1

    • Effects of chemical stoichiometry of channel region on bias instability in ZnO thin-film transistors (2011)
  • Hiramatsu Takahiro ID: 9000024132460

    Articles in CiNii:1

    • Analysis of subthreshold photo-leakage current in ZnO thin-film transistors using indium-ion implantation (2010)
  • Hiramatsu Takahiro ID: 9000024364326

    Articles in CiNii:1

    • Mechanism analysis of photoleakage current in ZnO thin-film transistors using device simulation (2010)
  • Hiramatsu Takahiro ID: 9000025011938

    Articles in CiNii:1

    • Influence of thermal annealing on microstructures of zinc oxide films deposited by RF magnetron sputtering (2007)
  • Hiramatsu Takahiro ID: 9000025068656

    Articles in CiNii:1

    • Effect of energetic particle bombardment on microstructure of zinc oxide films deposited by RF magnetron sputtering (2007)
  • Hiramatsu Takahiro ID: 9000025117609

    Articles in CiNii:1

    • Enhanced nucleation of microcrystalline silicon thin films deposited by inductively coupled plasma chemical vapor deposition with low-frequency pulse substrate bias (2010)
  • Hiramatsu Takahiro ID: 9000078517705

    Articles in CiNii:1

    • A 128×96 Pixel Stack-Type Color Image Sensor: Stack of Individual Blue-, Green-, and Red-Sensitive Organic Photoconductive Films Integrated with a ZnO Thin Film Transistor Readout Circuit (2011)
  • Hiramatsu Takahiro ID: 9000237909303

    Articles in CiNii:1

    • Mechanism analysis of photoleakage current in ZnO thin-film transistors using device simulation (2010)
  • Hiramatsu Takahiro ID: 9000237909328

    Articles in CiNii:1

    • Analysis of Hump Characteristics in Thin-Film Transistors with ZnO Channels Deposited by Sputtering at Various Oxygen Partial Pressures (2010)
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