Search Results1-20 of  32

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  • HOSOKI Shigeyuki ID: 9000000019895

    Central Research Laboratory, Hitachi Ltd. (1996 from CiNii)

    Articles in CiNii:1

    • Observation of Surface Phenomena with an STM (1996)
  • HOSOKI Shigeyuki ID: 9000005534751

    Central Research Laboratory, Hitachi, Ltd. (1980 from CiNii)

    Articles in CiNii:1

    • Surface Analysis of LaB_6 Single Crystal Thermionic Emitters (1980)
  • HOSOKI Shigeyuki ID: 9000005562733

    Central Research Laboratory (1996 from CiNii)

    Articles in CiNii:7

    • Observation for Crystal Surface of W<110>Field Emitter Tip by SEM (1985)
    • Tip Aspect Dependence in Angular Confinement of Electron Emission from Ti/W<001> Field Emitter (1987)
    • Initial Stage of Oxygen Adsorption onto a Si(111)-7×7 Surface Studied by Scanning Tunneling Microscopy (1994)
  • HOSOKI Shigeyuki ID: 9000005720613

    Articles in CiNii:1

    • FOREWORD (<Special Issue> Scanning Tunneling Microscopy) (1997)
  • HOSOKI Shigeyuki ID: 9000020058474

    Central Research Laboratory, Hitachi, Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Scanning tunneling microscope(STM) for an advanced device processes. (1989)
  • HOSOKI Shigeyuki ID: 9000020075882

    Central Research Laboratory, Hitachi, Ltd. (1980 from CiNii)

    Articles in CiNii:1

    • Field-Ion and Electron Microscopy Study of Carbon Field Emitters (1980)
  • HOSOKI Shigeyuki ID: 9000020095700

    Hitachi Central Research Laboratory (1967 from CiNii)

    Articles in CiNii:1

    • The Application of an Electron Beam Evaporator for Shadowing Technique (1967)
  • HOSOKI Shigeyuki ID: 9000020694300

    Articles in CiNii:1

    • Development of a practical scanning tunneling microscope(STM) and surface observations. (1988)
  • HOSOKI Shigeyuki ID: 9000021548638

    Central Research Laboratory, Hitachi, Ltd. (1977 from CiNii)

    Articles in CiNii:1

    • Basic Field Emission Properties of Rare-earth Hexa-borides (1977)
  • HOSOKI Shigeyuki ID: 9000252915440

    Central Research Laboratory, Hitachi Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Observation of surface defects using a scanning tunneling microscope(STM). (1989)
  • HOSOKI Shigeyuki ID: 9000252915510

    Central Research Laboratory, Hitachi Ltd., (1991 from CiNii)

    Articles in CiNii:1

    • Surface Modification by an STM. (1991)
  • HOSOKI Shigeyuki ID: 9000253325791

    Central Research Laboratory, Hitachi Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Surface modification using an STM:Atomic manipulation on a molybdenum-disulfide surface (1993)
  • HOSOKI Shigeyuki ID: 9000253647585

    Central Research Laboratory, Hitachi Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Scanning tunneling microscopy. (1989)
  • HOSOKI Shigeyuki ID: 9000254353015

    Central Research Laboratory, Hitachi Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • In-situ Dynamic Observations of Surface Phenomena and Atomic Manipulation using Scanning Tunneling Microscopy. (1997)
  • HOSOKI Shigeyuki ID: 9000257982643

    Central Research Laboratory, Hitachi, Ltd. (2003 from CiNii)

    Articles in CiNii:1

    • Structural Change of Si(001) Surfaces after Alternating Current Heating (2003)
  • Hosoki Shigeyuki ID: 9000002571735

    Articles in CiNii:24

    • Surface modification using an STM - Atomic manipulation on a molybdenum-disulfide surface - (1993)
    • 超高真空AFM/STM装置による表面観察 (走査プロ-ブ顕微鏡の最前線<特集>) (1991)
    • 走査型トンネル顕微鏡 (90年代のキ-テクノロジ-<特集>) (1990)
  • Hosoki Shigeyuki ID: 9000252761791

    Central Research Laboratory, Hitachi, Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Tunneling Acoustic Microscope (1989)
  • Hosoki Shigeyuki ID: 9000252948286

    Central Research Laboratory, Hitachi, Ltd. (1980 from CiNii)

    Articles in CiNii:1

    • Surface analysis of LaB6 single crystal thermionic emitters. (1980)
  • Hosoki Shigeyuki ID: 9000252982778

    Central Research Laboratory, Hitachi Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • <I>In Situ</I> Observation of Gold Adsorption onto Si(111)7×7 Surface by Scanning Tunneling Microscopy (1992)
  • Hosoki Shigeyuki ID: 9000254439377

    Hitachi Ltd. (1990 from CiNii)

    Articles in CiNii:1

    • Surface observation and analysis of Si using an STM. (1990)
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