Search Results1-20 of  428

  • HASEGAWA HIDEKI ID: 9000002102305

    Department of Oral Anatomy, School of Dentistry, Aichi-Gakuin University (2009 from CiNii)

    Articles in CiNii:2

    • The Effect of Type II Diabetes (non-insulin-dependent diabetes mellitus) on Implant Osseointegration (2006)
    • Effects of Diet Restriction on the T-cell Implant Osteogenesis Ability in Type 2 Diabetic Rats (2009)
  • HASEGAWA Hideki ID: 1000060001781

    Department of Biomedical Engineering, Graduate School of Biomedical Engineering, Tohoku University (2009 from CiNii)

    Articles in CiNii:364

    • Recent progress in indium phosphide based materials and devices (1996)
    • マルチメディア情報化社会と化合物半導体 (2000)
    • Chiral Recognition of Ru(phen)^<2+>_3 by Anionic Cyclodextrins (2000)
  • HASEGAWA Hideki ID: 9000000226746

    Research Center for Interface Quantum Electronics, and Graduate School of Electronics and Information Engineering, Hokkaido University (1996 from CiNii)

    Articles in CiNii:1

    • Scanning Tunneling Microscope Study of (001)InP Surface Prepared by Gas Source Molecular Beam Epitaxy (1996)
  • HASEGAWA Hideki ID: 9000000707433

    Department of Fixed Prosthodontics, School of Dentistry, AichGakuin University (1997 from CiNii)

    Articles in CiNii:3

    • Effect of Sandblasting on Titanium Castings (1997)
    • A Study of the Fit of Cast Titanium Crowns (1995)
    • Adhesive Resin Used to Fix Castable Ceramics (OCC) to Teeth (1996)
  • HASEGAWA Hideki ID: 9000001074091

    Department of Pathology, National Institute of Infectious Disease (1998 from CiNii)

    Articles in CiNii:1

    • Herpes encephalitis and paraneoplastic limbic encephalitis (1998)
  • HASEGAWA Hideki ID: 9000001074238

    Department of Molecular& Cellular Pathology, Hokkaido University Graduate School of Medicine (1998 from CiNii)

    Articles in CiNii:1

    • Meningeal large granular lymphocyte lymphoma (1998)
  • HASEGAWA Hideki ID: 9000001717030

    Research Center for Interface Quantum Electronics, and Graduate School of Electronics and Information Engineering, Hokkaido University (1997 from CiNii)

    Articles in CiNii:1

    • Toward Next Generation Electronics Based on Single Electron Devices (1997)
  • HASEGAWA Hideki ID: 9000001719461

    Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University (2000 from CiNii)

    Articles in CiNii:1

    • Novel Single Electron Memory Device Using Metal Nano-Dots and Schottky In-Plane Gate Quantum Wire Transistors (2000)
  • HASEGAWA Hideki ID: 9000001719916

    Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University (2000 from CiNii)

    Articles in CiNii:1

    • DLTS, PL and CL Study of Dominant Deep Level and Its Removal in InGaP/GaAs Heterostructure Grown by TBP-Based GSMBE (2000)
  • HASEGAWA Hideki ID: 9000001722386

    Research Center for Interface Quantum Electronics and Graduate School of Engineering, Hokkaido University (1995 from CiNii)

    Articles in CiNii:1

    • A Novel Lateral Surface Superlattice Structure Utilizing Schottky Barrier Height Control by Doped Silicon Interface Control Layers (1995)
  • HASEGAWA Hideki ID: 9000001722429

    Research Center for Interface Quantum Electronics and Department of Electrical Engineering Hokkaido University (1995 from CiNii)

    Articles in CiNii:1

    • Contactless and Nondestructive Characterization of Silicon Surfaces by Capacitance-Voltage and Photoluminescence Methods (1995)
  • HASEGAWA Hideki ID: 9000002025410

    Central Research Laboratory, Hitachi, Ltd. (2007 from CiNii)

    Articles in CiNii:1

    • Tandem Mass Spectrometry Using an Axially Resonant Excitation Linear Ion Trap (2007)
  • HASEGAWA Hideki ID: 9000002034817

    Central Research Laboratory, Hitachi, Ltd. (2007 from CiNii)

    Articles in CiNii:2

    • Development of a Two-Dimensional Mass Spectrometer Using an Axially Resonant Excitation Linear Ion Trap (2007)
    • プロテオーム解析に向けた質量分析の新技術--高周波イオントラップを用いた電子捕獲解離 (特集2 バイオテクノロジーの最新技術と動向) (2004)
  • HASEGAWA Hideki ID: 9000002119746

    Hokkaido University (2008 from CiNii)

    Articles in CiNii:1

    • Nanoelectronics and Surface Science (2008)
  • HASEGAWA Hideki ID: 9000004702357

    Department of Pathology and Cell Biology Research Laboratory, Tokai University School of Medicine (1981 from CiNii)

    Articles in CiNii:1

    • Immunohistochemical Localization of Secretory Component(SC) and Carcinoembryonic Antigen(CEA) in Human Gastric Mucosa. : (1981)
  • HASEGAWA Hideki ID: 9000004746129

    Research Center for Integrated Quantum Electronics and Graduate School of Electronics and Information Engineering (2003 from CiNii)

    Articles in CiNii:3

    • Cathodoluminescence In-Depth Spectroscopy Study of Yellow Luminescence in GaN (2003)
    • Research Trends and Prospects of Single Electronics (1998)
    • Research Trends and Prospects ofSingle Electronics (1998)
  • HASEGAWA Hideki ID: 9000004755447

    Mitsubishi Electric Corporation, Information Technology R&D Center (2014 from CiNii)

    Articles in CiNii:23

    • Signal processing for high-resolution synthetic aperture radar (2010)
    • An Order Decision Method of Multiple Aperture Mapdrift with Entropy in SAR Imagery (2000)
    • A limitation of the range-doppler algorithm to reconstruct wideband SAR images (2001)
  • HASEGAWA Hideki ID: 9000004778220

    Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University (1996 from CiNii)

    Articles in CiNii:2

    • Fabrication of InGaAs InAlAs Quantum Wire and Quantum Dot Structures on Patterned InP Substrates by Selective Molecular Beam Epitaxy (1996)
    • Charactorization of InGaAs Wires by Photoluminescence (1994)
  • HASEGAWA Hideki ID: 9000004837889

    Research Center for Integrated Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University (2003 from CiNii)

    Articles in CiNii:4

    • Gate Leakage in AlGaN/GaN Heterostructure Field Effect Transistors and Its Suppression by Novel Al_2O_3 Insulated Gate (2003)
    • Surface passivation of GaN and GaN/AlGaN heterostructures by dielectric films and its application to insulated-gate heterostructure transistors (2003)
    • Mechanisms of current collapse and gate leakage currents in AlGaN/GaN heterostructure field effect transistors (2003)
  • HASEGAWA Hideki ID: 9000005402569

    Graduate School of Science and Tech., Kobe Univ. (2004 from CiNii)

    Articles in CiNii:5

    • 21174 Fundamental Study on Recurrent Earthquake-Resisting Design : II. Response Characteristics and Predominant Period of Recurrent Unit Idealized Frames (2002)
    • Fundamental Study on Recurrent Earthquake-Resisting Design : I. Collapse Response Characteristics of Recurrent Unit Idealized Frames (2002)
    • 21196 Fundamental Study on Recurrent Earthquake-Resisting Design : IV. Seismic Response Analysis in Consideration of Viscosity and Friction on Recurrent Unit Frames (2003)
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