Search Results1-3 of  3

  • HAYASAKA Hiromi ID: 9000107313550

    Tokyo University of Agriculture and Technology (2007 from CiNii)

    Articles in CiNii:1

    • Defect Reduction in Polycrystalline Silicon Thin Films by Heat Treatment with High-Pressure H_2O Vapor (2007)
  • Hayasaka Hiromi ID: 9000025064160

    Articles in CiNii:1

    • Analysis of microwave absorption caused by free carriers in silicon (2009)
  • Hayasaka Hiromi ID: 9000392100211

    Japan Atomic Energy Agency (2009 from CiNii)

    Articles in CiNii:1

    • Leaching behavior of inorganic ions from simulated bituminized waste forms with concentrated salts (2009)
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