Search Results1-11 of  11

  • Hirano Yuuichi ID: 9000403865655

    Articles in CiNii:1

    • Force Measurement Enabling Precise Analysis by Dynamic Force Spectroscopy (2011)
  • HIRANO Yuuichi ID: 9000003724808

    慶応義塾大学大学院 (1998 from CiNii)

    Articles in CiNii:2

    • Grip Force Control by Detecting the Internal Strain Distribution Inside the Elastic Finger Having Curved Surface (1998)
    • Development of Strain Distribution Sensor Having Curved Surface for Grip Force Control (1998)
  • HIRANO Yuuichi ID: 9000004777895

    ULSI Laboratory, Mitsubishi Electric Corp. (2008 from CiNii)

    Articles in CiNii:12

    • Impact of Actively Body-bias Controlled (ABC) SOI SRAM for Low-Voltage and High-Speed Operation (2004)
    • 0.35μm Large-Scale SOI Gate Array using Field Shield Isolation Technology (1997)
    • Analyses of Radiation Tolerance in Field-Shield-Isolated SOI MOSFETs (1999)
  • HIRANO Yuuichi ID: 9000006719980

    Toyonaka High-Sch (1993 from CiNii)

    Articles in CiNii:1

    • 1p-ZJ-2 A Trend of New Curriculum at Many High Schools in Osaka (1993)
  • HIRANO Yuuichi ID: 9000107378525

    Articles in CiNii:1

    • Challenging for an ultra low-voltage SRAM by innovative design circuits and device technologies : A 0.5V 100MHz PD-SOI SRAM using Asymmetric MOSFET and Forward Body Bias (2010)
  • HIRANO Yuuichi ID: 9000255778568

    Articles in CiNii:1

    • Grip Force Control by Detecting the Internal Strain Distribution Inside the Elastic Finger Having Curved Surface. (1998)
  • HIRANO Yuuichi ID: 9000255778812

    Articles in CiNii:1

    • Development of Strain Distribution Sensor Having Curved Surface for Grip Force Control. (1998)
  • Hirano Yuuichi ID: 9000025037795

    Articles in CiNii:1

    • A robust silicon-on-insulator static-random-access-memory architecture by using advanced actively body-bias controlled technology (2008)
  • Hirano Yuuichi ID: 9000025088925

    Articles in CiNii:1

    • High soft-error tolerance body-tied silicon-on-insulator technology with partial trench isolation (2008)
  • Hirano Yuuichi ID: 9000401680126

    Articles in CiNii:1

    • Analyses of the Radiation-Caused Characteristics Change in SOI MOSFETs Using Field Shield Isolation (1999)
  • Hirano Yuuichi ID: 9000402038387

    Articles in CiNii:1

    • How does the molecular linker in dynamic force spectroscopy affect probing molecular interactions at the single-molecule level? (2016)
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