Search Results1-20 of  290

  • Hirose Masataka ID: 9000265541673

    Articles in CiNii:1

    • Construction of multi-N-heterocycle-containing organic solvent-soluble polymers with 1,3,4,6,9b-pentaazaphenalene (2014)
  • HIROSE Masataka ID: 9000000509927

    Department of Electrical Engineering, Hiroshima University (1992 from CiNii)

    Articles in CiNii:1

    • Control of Si native oxide growth (1992)
  • HIROSE Masataka ID: 9000000661357

    産業技術総合研究所 次世代半導体研究センター (2007 from CiNii)

    Articles in CiNii:5

    • ナノテクノロジーと情報技術 (2002)
    • Advanced semiconductor technology for system-on-chip (SOC) (2002)
    • 次世代デバイス開発とビームテクノロジー (2004)
  • HIROSE Masataka ID: 9000001716442

    Department of Electrical Engineering, Hiroshima University (1997 from CiNii)

    Articles in CiNii:1

    • Phosphorous Incorporation in Ultrathin Gate Oxides and Its Impact to the Network Structure (1997)
  • HIROSE Masataka ID: 9000001717628

    Organizing Committee SSDM'98 (1998 from CiNii)

    Articles in CiNii:1

    • PREFACE (1998)
  • HIROSE Masataka ID: 9000001720664

    Department of Electrical Engineering, Hiroshima University (1996 from CiNii)

    Articles in CiNii:1

    • Early Stages of Oxidation of Clean Si(111)-7x7 and Si(100)-2x1 Surfaces Studied by In-Situ High Resolution X-Ray Photoelectron Spectroscopy (1996)
  • HIROSE Masataka ID: 9000002045101

    産業技術総合研究所 (2008 from CiNii)

    Articles in CiNii:1

    • Silicon Photonics for Future Integrated Systems (2008)
  • HIROSE Masataka ID: 9000002165044

    Department of Electrical Engineering, Hiroshima University (1999 from CiNii)

    Articles in CiNii:1

    • Determination of Bandgap and Energy Band Alignment for High-Dielectric-Constant Gate Insulators Using High-Resolution X-ray Photoelectron Spectroscopy (1999)
  • HIROSE Masataka ID: 9000003243895

    Department of Electronics, Faculty of Engineering, Nagoya University (1967 from CiNii)

    Articles in CiNii:1

    • Annealing Effects of Paramagnetic Defects Introduced near Silicon Surface (1967)
  • HIROSE Masataka ID: 9000004778541

    Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (AIST) (2002 from CiNii)

    Articles in CiNii:10

    • Resonant Tunneling through SiO_2/Si Quantum Dot/SiO_2 Double Barrier Structures (1996)
    • Modeling of Soft Breakdown in Ultrathin Gate Oxides (1999)
    • Valence Band Alignment at Ultra-Thin SiO_2/Si (111) Interfaces as Determined by High-Resolution X-Ray Photoelectron Spectroscopy (1995)
  • HIROSE Masataka ID: 9000004781657

    Department of Electrical Engineering, Graduate School of Advanced Sciences of Matter, Hiroshima University:(Present office)Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology (2002 from CiNii)

    Articles in CiNii:5

    • Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique (1999)
    • Experimental Evidence of Carrier Depletion Effect near n^+Poly-Si Gate Side Wall/SiO_2 Interfaces for Sub-100nm nMOSFETs (2001)
    • Experimental Evidence of Carrier Depletion Effect near n^+Poly-Si Gate Side Wall/SiO_2 Interfaces for Sub-100nm nMOSFETs (2001)
  • HIROSE Masataka ID: 9000004813043

    Faculty of Engineering, Hiroshima University (1998 from CiNii)

    Articles in CiNii:5

    • Experimental Pattern Recognition System Using Bidirectional Optical Bus Lines (1997)
    • High-Efficiency Micromirrors and Branched Optical Waveguides on Si Chips (1995)
    • Control of Fine Particulate and Gaseous Contaminants by UV/Photoelectron Method (1996)
  • HIROSE Masataka ID: 9000004824834

    Articles in CiNii:1

    • Special Issue on Silicon Nanodevices (2001)
  • HIROSE Masataka ID: 9000004919353

    Tokyo Institute of Polytechnics (1998 from CiNii)

    Articles in CiNii:1

    • Paralyzing Characteristics Caused by Output Imbalance Traffic of Input, Shared Buffer ATM Switches (1998)
  • HIROSE Masataka ID: 9000005523714

    Department of Electronics, Faculty of Engineering, Nagoya University (1970 from CiNii)

    Articles in CiNii:1

    • Contact Properties of Metal-Silicon Schottky Barriers (1970)
  • HIROSE Masataka ID: 9000005526153

    Department of Electrical Engineering, Hiroshima University (2001 from CiNii)

    Articles in CiNii:37

    • Analytical Modelling of Quasi-Breakdown of Ultrathin Gate Oxides under Constant Current Stressing (1996)
    • Current Transport in Doped Polycrystalline Silicon (1980)
    • Localized States in Amorphous and Polycrystallized Si (1978)
  • HIROSE Masataka ID: 9000005653187

    Department of Electrical Engineering, Hiroshima University (1994 from CiNii)

    Articles in CiNii:1

    • Implanted Antimony Precipitation in Silicon Studied by Medium-Energy Ion Scattering (1994)
  • HIROSE Masataka ID: 9000005752067

    Max-Planck-Institut fuer Festkoerperforschung (1979 from CiNii)

    Articles in CiNii:1

    • Determination of Localized State Density Distribution in Glow Discharge Amorphous Silicon : B-1: AMORPHOUS SILICON AND SOLAR CELLS (1979)
  • HIROSE Masataka ID: 9000020182552

    広島大学工学部 (1991 from CiNii)

    Articles in CiNii:1

    • Native Oxide Formation on Silicon Wafer. (1991)
  • HIROSE Masataka ID: 9000020323151

    Department of Electrical Engineering, Hiroshima University (1989 from CiNii)

    Articles in CiNii:1

    • Cryogenic growth of polysilane. (1989)
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