Search Results1-20 of  25

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  • Hirose Yukinori ID: 9000025017116

    Articles in CiNii:1

    • Three-dimensional visualization technique for crystal defects in high performance p-channel metal-oxide-semiconductor field-effect transistors with embedded SiGe source/drain (Special issue: Solid state devices and materials) (2010)
  • HIROSE YUKINORI ID: 9000392082167

    TOSHIBA Corporation (2005 from CiNii)

    Articles in CiNii:1

    • Development of Nuclear Power Plant Flexible Maintenance System (VIII):-The maintenance training support system using virtual-reality technology in equipment isolation work- (2005)
  • HIROSE Yukinori ID: 9000001398483

    Wafer Process Engineering Development Division, LSI Manufacturing Technology Unit, Renesas Technology Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Microsampling technique for EBSP inspection on the cross-sections of copper trench lines in ULSIs (2004)
  • HIROSE Yukinori ID: 9000004777678

    Process Technology Development Div., Renesas Technology Corp. (2007 from CiNii)

    Articles in CiNii:8

    • Evaluation and Analysis Technique Using TEM (2003)
    • Crystal Structure Characterization of Metal Interconnects in ULSIs Using EBSP/OIM Technique (2004)
    • Three-dimensional Fine Structure Observation of Metal Silicide using Electron Tomography (2007)
  • HIROSE Yukinori ID: 9000004966129

    Articles in CiNii:3

    • 多層配線の3次元的評価技術 (特集:微細構造内の分析・観察技術) (1998)
    • Application of CVD-TiN/Ti barrier layer for contact plug processes (1997)
    • 0.15μm CMOS Process for High Performance and High Reliability (1995)
  • HIROSE Yukinori ID: 9000006419897

    Renesas Technology Corporation (2007 from CiNii)

    Articles in CiNii:2

    • Depth Profile Analysis of Nickel Silicide Films Using Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) (2007)
    • Microstructural Characterization of Electroplated Copper Films on Copper-Alloy Seed Layer (2007)
  • HIROSE Yukinori ID: 9000017284079

    Articles in CiNii:3

    • Development of Safety Support System for Nuclear Power Plant (2) (2000)
    • 計器のオンライン状態監視技術 (2010)
    • 209 Online Inspection of Sensors in Nuclear Power Plants (2008)
  • HIROSE Yukinori ID: 9000017550818

    Semiconductor Technology Academic Research Center (2010 from CiNii)

    Articles in CiNii:1

    • Defects in Cu/low-k Interconnects Probed Using Monoenergetic Positron Beams (2010)
  • HIROSE Yukinori ID: 9000021568734

    Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology|Nippon Atomic Industry Group Co., Ltd., Ukishima-cho, Kawasaki-ku, Kawasaki 210. (1989 from CiNii)

    Articles in CiNii:1

    • Fuel management effects on inherent safety of modular high temperature reactor. (1989)
  • HIROSE Yukinori ID: 9000392072162

    TOSHIBA CORPORATION (2006 from CiNii)

    Articles in CiNii:1

    • Monitoring of Human Behavioral History using RFID (2006)
  • Hirose Yukinori ID: 9000047372227

    Articles in CiNii:1

    • Characterization of Low-k/Cu Damascene Structures Using Monoenergetic Positron Beams (2009)
  • Hirose Yukinori ID: 9000392070423

    Articles in CiNii:1

    • Development of Information Provide System for Nuclear Power Plant Monitoring System using Agent Technology (2004)
  • Hirose Yukinori ID: 9000392085890

    TOSHIBA Corporation (2005 from CiNii)

    Articles in CiNii:1

    • Electronic Mail Based Repport System for Nuclear Emergency (2005)
  • Hirose Yukinori ID: 9000392092794

    Toshiba Corporation Power Systems Company, Power and Industrial Systems Research and Development Center (2008 from CiNii)

    Articles in CiNii:1

    • Online Monitoring of Sensor Drift (2008)
  • Hirose Yukinori ID: 9000392093917

    TOSHIBA Corporation (2008 from CiNii)

    Articles in CiNii:1

    • Ontology Database of Emergency Reports Based on Time-Phase of Nuclear Emergency Preparedness (2008)
  • Hirose Yukinori ID: 9000392110116

    Toshiba Corporation (2008 from CiNii)

    Articles in CiNii:1

    • Development of Plant Monitoring Technique by Using Statistical Method (2008)
  • Hirose Yukinori ID: 9000401786391

    Articles in CiNii:1

    • 2010-04-20 (2010)
  • Hirose Yukinori ID: 9000401792783

    Articles in CiNii:1

    • 2010-12-20 (2010)
  • Hirose Yukinori ID: 9000401797072

    Articles in CiNii:1

    • Structure-Modification Model of Porogen-Based Porous SiOC Film with Ultraviolet Curing (2011)
  • Hirose Yukinori ID: 9000401797082

    Articles in CiNii:1

    • Analysis of Sidewall Damage Layer in Low-kFilm Using the Interline Dielectric Capacitance Measurements (2011)
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