Search Results1-12 of  12

  • HIURA Yohei ID: 9000001655488

    MICROELECTRONICS ENGINEERING LABORATORY, TOSHIBA CORPORATION, SEMICONDUCTOR COMPANY (1999 from CiNii)

    Articles in CiNii:1

    • Low-Resistivity W/WSiN/poly-Si "Polymetal" Gate Electrode Technology (1999)
  • HIURA Yohei ID: 9000004779061

    ソニー(株)半導体事業本部セミコンダクタテクノロジー開発部門 (2007 from CiNii)

    Articles in CiNii:4

    • A New Self-Data-Refresh Scheme for 16Mb Flash EEPROM : to realize sector erase operation (1993)
    • Comparison of Current Flash EEPROM Erasing Methods : Stability and How to control (1993)
    • A 3.3V-only 16Mb Flash Memory with a new Row-Decoding Scheme (1996)
  • Hiura Yohei ID: 9000004872674

    Semiconductor Device Engineering Laboratory, Toshiba Corporation (1994 from CiNii)

    Articles in CiNii:1

    • A 16-Mb Flash EEPROM with a New Self-Data-Refresh Scheme for a Sector Erase Operation (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994)) (1994)
  • Hiura Yohei ID: 9000252764022

    Research Institute of Electrical Communication, Tohoku University (1991 from CiNii)

    Articles in CiNii:1

    • <I>In Situ</I> Observation of Electromigration in Cu Film Using Scanning μ-Reflection High-Energy Electron Diffraction Microscope (1991)
  • Hiura Yohei ID: 9000252969949

    Research Institute of Electrical Communication, Tohoku University (1989 from CiNii)

    Articles in CiNii:1

    • Development of Scanning μ-RHEED Microscopy for Imaging Polycrystal Grain Structure in LSI (1989)
  • Hiura Yohei ID: 9000252978570

    Research Institute of Electrical Communication, Tohoku University (1991 from CiNii)

    Articles in CiNii:1

    • Single Crystallization of Aluminum on SiO<SUB>2</SUB> by Thermal Annealing and Observation with Scanning μ-RHEED Microscope (1991)
  • Hiura Yohei ID: 9000392705087

    Articles in CiNii:1

    • Development of Scanning μ-RHEED Microscopy for Imaging Polycrystal Grain Structure in LSI (1989)
  • Hiura Yohei ID: 9000392717946

    Articles in CiNii:1

    • <I>In Situ</I> Observation of Electromigration in Cu Film Using Scanning μ-Reflection High-Energy Electron Diffraction Microscope (1991)
  • Hiura Yohei ID: 9000392718881

    Articles in CiNii:1

    • Single Crystallization of Aluminum on SiO<SUB>2</SUB> by Thermal Annealing and Observation with Scanning μ-RHEED Microscope (1991)
  • Hiura Yohei ID: 9000401612170

    Articles in CiNii:1

    • 1989-11-20 (1989)
  • Hiura Yohei ID: 9000401623917

    Articles in CiNii:1

    • 1991-12-30 (1991)
  • Hiura Yohei ID: 9000401626722

    Articles in CiNii:1

    • 1991-01-01 (1991)
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