Search Results1-15 of  15

  • HOKARI Yasuaki ID: 9000004152306

    Japan Electronics & Information Technology Industries Association (2002 from CiNii)

    Articles in CiNii:2

    • Review of the ITRS 2001 Technology Roadmap (2002)
    • Review of the ITRS 2001 Technology Roadmap (2002)
  • HOKARI Yasuaki ID: 9000005730980

    Central Research Laboratories, Nippon Electric Co., Ltd. (1976 from CiNii)

    Articles in CiNii:1

    • 228 by 248 Cell Charge-Coupled Image Sensor with Two-Level Overlapping Poly-Silicon Electrodes : B-4: IMAGING DEVICES (1976)
  • Hokari Yasuaki ID: 9000005306133

    Silicon Systems Research Laboratories, NEC Corporation (1999 from CiNii)

    Articles in CiNii:19

    • 多目的な2/3インチ130万画素CCDの開発 (特集 イメ-ジセンサの新潮流とCCDカメラ) (1997)
    • New Shunt Wiring Technologies for HDTV FIT-CCD Image Sensors (1993)
    • A 2/3-inch 2M Pixel IT-CCD Image Sensor (1994)
  • Hokari Yasuaki ID: 9000005313738

    Silicon Systems Res.Labs.NEC (2000 from CiNii)

    Articles in CiNii:4

    • A 2M Pixel FIT-CCD Image Sensor for HDTV Cameras (1992)
    • Low Noise Readout Circuit for Uncooled Infrared Focal Plane Array (2000)
    • Frame Transfer Driving Method for FIT-CCD Image Sensor (1992)
  • Hokari Yasuaki ID: 9000014462095

    NEC Corporation (1994 from CiNii)

    Articles in CiNii:2

    • A 2/3-inch 2M Pixel IT-CCD Image Sensor (1994)
    • 1)2/3インチ200万画素IT-CCDイメージセンサ([情報入力研究会コンシューマエレクトロニクス研究会]合同) (1994)
  • Hokari Yasuaki ID: 9000252943690

    Central Research Laboratories, Nippon Electric Co., Ltd. (1977 from CiNii)

    Articles in CiNii:1

    • Secondary Defect Generation Suppression in Heavily Boron Implanted Silicon Wafers by HCl Oxidation (1977)
  • Hokari Yasuaki ID: 9000252943959

    Central Research Laboratories, Nippon Electric Co., Ltd. (1977 from CiNii)

    Articles in CiNii:1

    • Video Defects in Charge-Coupled Image Sensors (1977)
  • Hokari Yasuaki ID: 9000252946271

    Central Research Laboratories, Nippon Electric Co., Ltd. (1979 from CiNii)

    Articles in CiNii:1

    • Secondary Defect Generation Suppression and Diffusivity Restraint in Heavily Phosphorus Implanted Silicon by HCl Oxidation (1979)
  • Hokari Yasuaki ID: 9000392678715

    Articles in CiNii:1

    • Secondary Defect Generation Suppression and Diffusivity Restraint in Heavily Phosphorus Implanted Silicon by HCl Oxidation (1979)
  • Hokari Yasuaki ID: 9000392681403

    Articles in CiNii:1

    • Video Defects in Charge-Coupled Image Sensors (1977)
  • Hokari Yasuaki ID: 9000392682706

    Articles in CiNii:1

    • Secondary Defect Generation Suppression in Heavily Boron Implanted Silicon Wafers by HCl Oxidation (1977)
  • Hokari Yasuaki ID: 9000401582823

    Articles in CiNii:1

    • Video Defects in Charge-Coupled Image Sensors (1977)
  • Hokari Yasuaki ID: 9000401585513

    Articles in CiNii:1

    • Secondary Defect Generation Suppression and Diffusivity Restraint in Heavily Phosphorus Implanted Silicon by HCI Oxidation (1979)
  • Hokari Yasuaki ID: 9000402053175

    Articles in CiNii:1

    • 228 by 248 Cell Charge-Coupled Image Sensor with Two-Level Overlapping Poly-Silicon Electrodes (1976)
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