Search Results1-5 of  5

  • Honda Toshifumi ID: 9000241524375

    Articles in CiNii:1

    • Enhanced Scattered Light Imaging of Nanoparticles by Controlling the Polarization Distribution with Photonic Crystals (2013)
  • HONDA Toshifumi ID: 9000014618217

    Production Engineering Research Laboratory, Hitachi Ltd (2011 from CiNii)

    Articles in CiNii:7

    • High-Sensitivity Detection of Slight Deformation Using Multiple SEM Images (2009)
    • Model Based Defect Detection in Multi-Dimensional Vector Spaces (2011)
    • Model Based Defect Detection in Multi-Dimensional Vector Spaces (2011)
  • Honda Toshifumi ID: 9000242074374

    Yokohama Research Laboratory, Hitachi, Ltd. (2013 from CiNii)

    Articles in CiNii:1

    • Classification and Size Estimation of Wafer Defects by Using Scattered Light Distribution (2013)
  • Honda Toshifumi ID: 9000258656883

    Mitsui High-tec, Inc. (2012 from CiNii)

    Articles in CiNii:1

    • Development of Auto-Correction Type Surface Grinder System Using on-Machine Measurement (2012)
  • Honda Toshifumi ID: 9000402014311

    Articles in CiNii:1

    • Enhanced Scattered Light Imaging of Nanoparticles by Controlling the Polarization Distribution with Photonic Crystals (2013)
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