Search Results1-20 of  52

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  • Horio Yoshimi ID: 9000025058367

    Articles in CiNii:1

    • Auger intensity from Si(001)2x2-Al surface excited by wave-field in medium-energy electron diffraction (2009)
  • HORIO Yoshimi ID: 9000006482655

    Department of Electrical Engineering and Electronics, Daido Institute of Technology (2002 from CiNii)

    Articles in CiNii:1

    • Energy-Filtered Reflection High-Energy Electron Diffraction Apparatus Combined with Energy-Loss Measurement System (2002)
  • HORIO Yoshimi ID: 9000253648964

    Department of Quantum Engineering, Graduate School of Engineering, Nagoya University (1996 from CiNii)

    Articles in CiNii:1

    • New Informations Obtained by Energy Filtered RHEED. (1996)
  • HORIO Yoshimi ID: 9000257982395

    Department of Applied Electronics, Daido Institute of Technology (2001 from CiNii)

    Articles in CiNii:1

    • AFM Observation of the Surface Morphology of CaF2 Film Grown on Si(111) 7*7 Substrate. (2001)
  • HORIO Yoshimi ID: 9000257983962

    Department of Electrical and Electronic Engineering, School of Engineering, Daido University (2011 from CiNii)

    Articles in CiNii:1

    • Morphological Evaluation of Nano Cluster by RHEED (2011)
  • HORIO Yoshimi ID: 9000261669814

    Articles in CiNii:2

    • Incident Electron Wave-Field at Si(001) Surface by RHEED (2013)
    • Polarity Determination of ZnO(0001) Surface by RHEED Rocking Curve (2016)
  • HORIO Yoshimi ID: 9000361254414

    Daido University (2017 from CiNii)

    Articles in CiNii:1

    • Miscellaneous thoughts on RHEED (2017)
  • Horio Yoshimi ID: 1000000238792

    Department of Electrical and Electronic Engineering, School of Engineering, Daido University (2011 from CiNii)

    Articles in CiNii:27

    • 新しいスピン偏極電子線源 (2000)
    • Observation of CaF_2 Growht on Si(111)7×7 Surface by RHEED (2000)
    • AFM Observation of the Surface Morphology of CaF_2 Film Grown on Si(111) 7×7 Substrate (2001)
  • Horio Yoshimi ID: 9000006180048

    Articles in CiNii:3

    • Correlation between Auger electron intensity from adsorbates and incident electron wave-field (2008)
    • Morphological Evaluation or Ge nano-cluster by Surface Electron Diffraction Method (2011)
    • Growth mode and surface morphology of insulator film grown on semiconductor substrate (2002)
  • Horio Yoshimi ID: 9000025009446

    Articles in CiNii:1

    • Temperature Dependence of Oxygen Diffusion and Crystal Structure for Thermally Oxidized Titanium Thin Films (2012)
  • Horio Yoshimi ID: 9000239571663

    Daido Univ. (2012 from CiNii)

    Articles in CiNii:1

    • 20aFF-8 Rocking curves and Auger intensities excited by RHEED far Si(001) surface (2012)
  • Horio Yoshimi ID: 9000243743651

    Dept. of Eng. Daido Univ (2015 from CiNii)

    Articles in CiNii:3

    • Structure Analysis of Si(001)2×1 Surface at High Temperature by Many-Beam RHEED (2013)
    • 9pPSA-112 Development of EF-MEED Apparatus (2014)
    • 21aAB-13 Observation of Ge hut cluster by FE-MEED (2015)
  • Horio Yoshimi ID: 9000257783307

    Department of Electrical and Electronic Engineering, School of Engineering, Daido University, Japan (2012 from CiNii)

    Articles in CiNii:1

    • Morphological Evaluation of Ge Nanoclusters by Spot Shape of Surface Electron Diffraction (2012)
  • Horio Yoshimi ID: 9000257784184

    Department of Electrical and Electronic Engineering, School of Engineering, Daido Institute of Technology, Japan (2006 from CiNii)

    Articles in CiNii:1

    • Kikuchi Patterns Observed by New Astrodome RHEED (2006)
  • Horio Yoshimi ID: 9000257784770

    Department of Electrical and Electronic Engineering, Daido Institute of Technology, Japan (2009 from CiNii)

    Articles in CiNii:1

    • Correlation between Auger Intensity and Wave-Field Intensity for Si(001)2*2-Al Surface (2009)
  • Horio Yoshimi ID: 9000258140140

    Department of Applied Electronics, Daido Institute of Technology, 2–21 Daido–cho, Minami–ku, Nagoya 457, Japan (1998 from CiNii)

    Articles in CiNii:1

    • Behaviors of Auger Intensities Emitted from a Si(111).RAD.3*.RAD.3-Al Surface During Incident Beam Rocking of Reflection High-Energy Electron Diffraction. (1998)
  • Horio Yoshimi ID: 9000258148308

    Department of Applied Electronics, Daido Institute of Technology, 2–21 Daido–cho, Minami–ku, Nagoya 457–8531, Japan (1999 from CiNii)

    Articles in CiNii:1

    • Different Growth Modes of Al on Si(111)7*7 and Si(111).RAD.3*.RAD.3-Al Surfaces. (1999)
  • Horio Yoshimi ID: 9000258162296

    Department of Electrical Engineering and Electronics, Daido Institute of Technology, 10-3 Takiharu-cho, Minami-ku, Nagoya 457-8530, Japan (2002 from CiNii)

    Articles in CiNii:1

    • Energy-Filtered Reflection High-Energy Electron Diffraction Apparatus Combined with Energy-Loss Measurement System. (2002)
  • Horio Yoshimi ID: 9000258700703

    Articles in CiNii:1

    • Kikuchi Pattern in RHEED from Vicinal Surface (2004)
  • Horio Yoshimi ID: 9000258702811

    Daido Inst. of Tech. (2007 from CiNii)

    Articles in CiNii:1

    • RHEED Wave Field Constructed in Si(001)2x2-Al Surface (2007)
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