Search Results1-20 of  22

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  • Ichihashi Mikio ID: 9000017893743

    Articles in CiNii:1

    • Iron energy of the iron-induced emission electron microscope (1969)
  • Ichihashi Mikio ID: 9000017893836

    Articles in CiNii:1

    • Correction of spherical aberration by means of a thin conducting foil (1971)
  • ICHIHASHI Mikio ID: 9000000791122

    Instrument Division, Hitachi Ltd (1999 from CiNii)

    Articles in CiNii:2

    • Development of a real-time defocus image modulation processing electron microscope. I. Construction (1999)
    • Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms (1999)
  • ICHIHASHI Mikio ID: 9000018654914

    EcoTopia Science Institute, Nagoya University (2007 from CiNii)

    Articles in CiNii:2

    • Application of electron holography to the determination of contact potential difference in an AlGaN/AlN/Si heterostructure (2007)
    • Electron-beam-induced-current investigation of GaN/AlGaN/Si heterostructures using scanning transmission electron microscopy (2007)
  • ICHIHASHI Mikio ID: 9000107311295

    Division of Nano-materials Science, EcoTopia Science Institute, Nagoya University (2007 from CiNii)

    Articles in CiNii:1

    • New Computer Simulation Software of Electron Trajectories for Evaluation of Magnetic Field Immersion-Type Field Emission Gun (2007)
  • Ichihashi Mikio ID: 9000005538597

    Faculty of Engineering, Nagoya University (1969 from CiNii)

    Articles in CiNii:1

    • The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination (1969)
  • Ichihashi Mikio ID: 9000017113487

    Eco Topia Sci. Inst. Nagoya Univ. (2010 from CiNii)

    Articles in CiNii:3

    • Development of Real-Time Defous-Image Modulation Electron Microscope (2000)
    • Development of Micro-aperture for Annular Pupil on Electron Optics by Focused Ion Beam Technique (2007)
    • 21aHS-6 Probe formation with annular apertures in aberration-corrected STEMS : Simulation analysis (2010)
  • Ichihashi Mikio ID: 9000252758173

    Central Research Laboratory, Hitachi Ltd. (1984 from CiNii)

    Articles in CiNii:1

    • Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron Diffraction (1984)
  • Ichihashi Mikio ID: 9000252948627

    Cooperative Laboratories, VLSI Technology Research Association (1980 from CiNii)

    Articles in CiNii:1

    • Proximity Effect in an EB Lithographic System Using a Field Emission (FE) Electron Gun (1980)
  • Ichihashi Mikio ID: 9000252951123

    Cooperative Laboratories, VLSI Technology Research Association (1982 from CiNii)

    Articles in CiNii:1

    • Fabrication of Submicron Pattern with an EB Lithographic System Using a Field Emission (FE) Electron Gun (1982)
  • Ichihashi Mikio ID: 9000252992036

    Faculty of Engineering, Nagoya University (1969 from CiNii)

    Articles in CiNii:1

    • The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination (1969)
  • Ichihashi Mikio ID: 9000252992563

    Articles in CiNii:1

    • Korrektur vom Öffnungsfehler der Elektronenlinse (1970)
  • Ichihashi Mikio ID: 9000253491877

    日立製作所中央研究所 (1991 from CiNii)

    Articles in CiNii:1

    • 200kV Field Emission TEM. (1991)
  • Ichihashi Mikio ID: 9000253491908

    日立製作所 計測器事業部 科学機器システム本部 (1992 from CiNii)

    Articles in CiNii:1

    • Microminiaturized High Resolution SEM. (1992)
  • Ichihashi Mikio ID: 9000392689791

    Articles in CiNii:1

    • Proximity Effect in an EB Lithographic System Using a Field Emission (FE) Electron Gun (1980)
  • Ichihashi Mikio ID: 9000392693553

    Articles in CiNii:1

    • Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron Diffraction (1984)
  • Ichihashi Mikio ID: 9000392694707

    Articles in CiNii:1

    • Fabrication of Submicron Pattern with an EB Lithographic System Using a Field Emission (FE) Electron Gun (1982)
  • Ichihashi Mikio ID: 9000401586018

    Articles in CiNii:1

    • Proximity Effect in an EB Lithographic System Using a Field Emission (FE) Electron Gun (1980)
  • Ichihashi Mikio ID: 9000401590854

    Articles in CiNii:1

    • Fabrication of Submicron Pattern with an EB Lithographic System Using a Field Emission (FE) Electron Gun (1982)
  • Ichihashi Mikio ID: 9000401595400

    Articles in CiNii:1

    • Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron Diffraction (1984)
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