Search Results1-20 of  129

  • ICHIMURA SHINGO ID: 9000000951801

    産業技術総合研究所・極微プロファイル計測研究ラボ (2004 from CiNii)

    Articles in CiNii:4

    • Recent Progress of Auger Electron Spectroscopy (2002)
    • Now is Time to Challenge the Development of New Scientific Instruments (2004)
    • 表面分析の進展と化学工業との接点 (2004)
  • ICHIMURA Shingo ID: 9000000007653

    National Institute of Advanced Instrumental Science and Technology, Japan (2011 from CiNii)

    Articles in CiNii:24

    • Observation of Surface by Surface Electron Spectroscopic Tomography (1995)
    • Adsorption of Benzene on Si(111)7×7 at Room Temperature Observed by Second Harmonic Generation (SHG) (1995)
    • Mass- and Electron-Spectroscopic Observation of Resist Decomposition by Synchrotron Radiation (1983)
  • ICHIMURA Shingo ID: 9000000098671

    Electrotechnical Laboratory (1997 from CiNii)

    Articles in CiNii:1

    • A New Method for Cleaning the Surface of Ultra High-Purity Iron by High-Purity Ozone Exposure and UV Irradiation (1997)
  • ICHIMURA Shingo ID: 9000000460551

    Frontier Technology Division, Electrotechnical Laboratory (2001 from CiNii)

    Articles in CiNii:1

    • Nitrogen Profile in SiO_xN_y Prepared by Thermal Nitridation of Ozone Oxide (2001)
  • ICHIMURA Shingo ID: 9000001016010

    National Institute of Advanced Industrial Science and Technology (AIST) (2012 from CiNii)

    Articles in CiNii:2

    • 最新の酸化膜作製技術とその応用 (2003)
    • International standardization of nanotechnology (2012)
  • ICHIMURA Shingo ID: 9000001728316

    産業技術総合研究所 計測フロンティア研究部門 (2007 from CiNii)

    Articles in CiNii:3

    • Analysis of Oxygen and Hydrogen Adsorption on Nb(100) Surface by Scanning Tunneling Microscopy (2006)
    • 第67回応用物理学会学術講演会報告 (2007)
    • Report on the 2nd Plenary Meeting of the ISO TC 229 (Nanotechnology) (2006)
  • ICHIMURA Shingo ID: 9000001790263

    Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Science and Technology (AIST) (2006 from CiNii)

    Articles in CiNii:2

    • Observation of Sputtered Si Surface Irradiated with Metal Cluster Complex Ions (2006)
    • Production of Stable Ion Beam of Os_3(CO)_<12> with Compact Metal-Cluster-Complex Ion Source (2006)
  • ICHIMURA Shingo ID: 9000005531689

    National Institute of Advanced Industrial Science and Technology (AIST) (2010 from CiNii)

    Articles in CiNii:13

    • Sensitivity of Ion-Imaging Method and Mass Analysis using an Imaging Detector (1995)
    • Comparison of the Counting Efficiencies of an Imaging Counter and Electric-pulse Counter (1996)
    • Pressure Measurement in XHV Region Using Nonresonant Multiphoton Ionization by Picosecond Pulsed Laser (1994)
  • ICHIMURA Shingo ID: 9000005569574

    Surface Engineering Section, Electrotechnical Laboratory (1995 from CiNii)

    Articles in CiNii:1

    • Adsorption and Thermal or Photodecomposition of Triethylgallium and Trimethylgallium on Si(111)-7×7 (1995)
  • ICHIMURA Shingo ID: 9000005654643

    Electrotechnical Laboratory (1994 from CiNii)

    Articles in CiNii:1

    • Effect of Optical Breakdown on Second Harmonic Generation from Si(111)7×7 with Nd:YAG Laser (1994)
  • ICHIMURA Shingo ID: 9000005735833

    Electrotechnical Laboratory MITI (1995 from CiNii)

    Articles in CiNii:1

    • Application of STM Nanometer-Size Oxidation Process to Planar-Type MIM Diode (1995)
  • ICHIMURA Shingo ID: 9000005925219

    Electrotechnical Laboratory (2000 from CiNii)

    Articles in CiNii:1

    • Initial Oxidation of Si(100)2×1 by Ozone:Transition of Growth Kinetics from Adsorption to Ultrathin Film Growth (2000)
  • ICHIMURA Shingo ID: 9000020060321

    Electrotechnical Lab. (1988 from CiNii)

    Articles in CiNii:1

    • Report of VAMAS-SCA-WG in Japan. (1988)
  • ICHIMURA Shingo ID: 9000020097768

    Electrotechnical Laboratory (1991 from CiNii)

    Articles in CiNii:1

    • Extremely-high vacuum system for the pressure measurement using the laser-ionization method. (1991)
  • ICHIMURA Shingo ID: 9000020100501

    Electrotechnical Laboratory (1990 from CiNii)

    Articles in CiNii:1

    • Pressure measurement with laser. 2. A new ion counting system for laser generated ions.:2. A New Ion Counting System for Laser Generated Ions (1990)
  • ICHIMURA Shingo ID: 9000020103678

    Electrotechnical Laboratory (2001 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (2001)
  • ICHIMURA Shingo ID: 9000020107625

    Electrotechnical Laboratory (1988 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1988)
  • ICHIMURA Shingo ID: 9000020125245

    Electrotechnical Laboratory (1982 from CiNii)

    Articles in CiNii:1

    • Basis of Quantitative Auger Aualysis (1982)
  • ICHIMURA Shingo ID: 9000020151285

    Electrotechnical Laboratory (1990 from CiNii)

    Articles in CiNii:1

    • Pressure measurement with laser. 1. Laser-ionization characteristics of various kinds of gases.:1. Laser-Ionization Characteristics of Various Kinds of Gases (1990)
  • ICHIMURA Shingo ID: 9000020158459

    Electrotechnical Laboratory (1987 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1987)
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