Search Results1-20 of  78

  • 1 / 4
  • Ichinokawa Takeo ID: 9000009548800

    Articles in CiNii:1

    • Development of Analytical Electron Microscopy and Its Future (Development of Electron Microscopy and its Future--Proceedings of the Thirtieth Anniversary of Japanese Society of Electron Microscopy) (1979)
  • ICHINOKAWA Takeo ID: 1000070063310

    Articles in CiNii:273

    • Homoepitaxial Growth on Si(110) Investigated by Scanning Tunneling Microscopy (1998)
    • Thermal Desorption Process on H/Si(110) Investigated by Scanning Tunneling Microscopy (1998)
    • 表面の構造を観察する - 超高真空走査型電子顕微鏡 (UHV-SEM) - (1992)
  • ICHINOKAWA Takeo ID: 9000000254083

    早稲田大学 (2000 from CiNii)

    Articles in CiNii:2

    • Scanning Electron Microscope (2000)
    • 走査型LEED顕微鏡 (1986)
  • ICHINOKAWA Takeo ID: 9000003240915

    Department of Applied Physics, Waseda University (1963 from CiNii)

    Articles in CiNii:1

    • Measurements of evaporated film thickness and concentration by electron probe X-ray microanalyzer. (1963)
  • ICHINOKAWA Takeo ID: 9000003245969

    Department of Applied Physics Waseda University (1951 from CiNii)

    Articles in CiNii:1

    • Effect of Stress on Domain Structure of Tungsten Trioxide WO_3. (1951)
  • ICHINOKAWA Takeo ID: 9000003271963

    Department of Applied Physics, Waseda University (1972 from CiNii)

    Articles in CiNii:1

    • Kikuchi Patterns and Inelastic Scattering (1972)
  • ICHINOKAWA Takeo ID: 9000003273308

    Department of Applied Physics, Waseda University (1974 from CiNii)

    Articles in CiNii:1

    • Contrast reversals of pseudo-Kikuchi band and lines due to detector position in scanning electron microscopy (1974)
  • ICHINOKAWA Takeo ID: 9000003277541

    Department of Applied Physics,School of Science and Engineering,Waseda University (1985 from CiNii)

    Articles in CiNii:2

    • A New Normalization Method for the Electron Energy-Loss Spectrum (1981)
    • Experimental Study of Inelastic Process at the Crystal Surface in Angle Resolved Low-Energy Electron Energy Loss Spectroscopy (1985)
  • ICHINOKAWA Takeo ID: 9000003284061

    Department of Applied Physics, Waseda University (1972 from CiNii)

    Articles in CiNii:1

    • Contrast Reversal of Kikuchi Bands in Transmission Electron Diffraction (1972)
  • ICHINOKAWA Takeo ID: 9000003284172

    Department of Applied Physics, Waseda University (1972 from CiNii)

    Articles in CiNii:1

    • Measurements of ratio of abnomal to normal absorption coefficients for electrons in crystal from pseudo-Kikuchi patterns (1972)
  • ICHINOKAWA Takeo ID: 9000005527445

    Department of Applied Physics, Waseda University (1974 from CiNii)

    Articles in CiNii:1

    • Charging Effect of Specimen in Scanning Electron Microscopy (1974)
  • ICHINOKAWA Takeo ID: 9000005752002

    Department of Applied Physics, Waseda University (1978 from CiNii)

    Articles in CiNii:1

    • Valiation of X-Ray Emission from GaAs Single Crystal with Incident Electron Beam Direction (1978)
  • ICHINOKAWA Takeo ID: 9000020079677

    早稲田大学理工学部 (1991 from CiNii)

    Articles in CiNii:9

    • Analytical Electron Microscopy by Electron Energy Loss Spectra (1983)
    • 光電子顕微鏡 (1982)
    • Surface Wave Resonance (1978)
  • ICHINOKAWA Takeo ID: 9000020735043

    Articles in CiNii:1

    • Combination of STM with SEM. (1987)
  • ICHINOKAWA Takeo ID: 9000021528051

    早稲田大学理工学部 (1978 from CiNii)

    Articles in CiNii:1

    • Temperature Dependence of Sputtering Rate of Alkali Halides by Argon Ion Bombardment (1978)
  • ICHINOKAWA Takeo ID: 9000021581751

    Department of Applied Physics, Waseda University (1998 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (1998)
  • ICHINOKAWA Takeo ID: 9000045506882

    Department of Applied Physics, Waseda University (1973 from CiNii)

    Articles in CiNii:1

    • Simple Electron Monochromator of Three-Diaphragm Einzel Lens (1973)
  • ICHINOKAWA Takeo ID: 9000252843480

    Dept of Applied Physics, Waseda University (1962 from CiNii)

    Articles in CiNii:1

    • Detection of Carbon with X-Ray Scanning Microanalyzer (1962)
  • ICHINOKAWA Takeo ID: 9000253241404

    Physical Institute, Nagoya University (1954 from CiNii)

    Articles in CiNii:1

    • On the Inelastic Scattering in Electron Diffraction (1954)
  • ICHINOKAWA Takeo ID: 9000253316516

    Department of Applied Physics, Faculty of Science and Engineering, Waseda University (1960 from CiNii)

    Articles in CiNii:1

    • Intensity Measurement of Electron Diffraction Beam by Scintillation Counter (1960)
  • 1 / 4
Page Top