Search Results1-20 of  62

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  • Iiyama Koichi ID: 9000007332758

    Articles in CiNii:1

    • Circuit Model Interpretation of Locking Characteristics of Optically Injection-Locked Semiconductor Laser (1988)
  • IIYAMA Koichi ID: 1000090202837

    Graduate School of Natural Science and Technology, Kanazawa University (2014 from CiNii)

    Articles in CiNii:66

    • Two terminal InP/InGaAs heterojunction phototransistor with lateral photodiode as sensing section (2005)
    • Effect of Oxidation by Ultraviolet & Ozone and Subsequent Nitridation by Electron Cyclotron Plasma on Gate Portion of GaAs-FETs (2005)
    • GaAs-MISFET with Oxi-nitrided Gate Film Formed by New Process Utilizing Al-layer as Resist Film For Selective Etching (2005)
  • IIYAMA Koichi ID: 9000001479798

    Graduate School of Natural Science and Technology, Kanazawa University (2005 from CiNii)

    Articles in CiNii:1

    • Oxidation of InAlAs and Its Application to Gate Insulator of InAlAs/InGaAs Metal Oxide Semiconductor High Electron Mobility Transistor (2005)
  • IIYAMA Koichi ID: 9000004813214

    Graduate School of Natural Science and Technology, Kanazawa University (2001 from CiNii)

    Articles in CiNii:4

    • Effect of Laser Phase-Induced Intensity Noise on Multiplexed Fiber-Optic Sensor System Using Optical Loop with Frequency Shifter (1996)
    • Application of Brightness of Scanning Electron Microscope Images to Measuring Thickness of Nanometer-Thin SiO_2 Layers on Si Substrates (2001)
    • Two Levels of Ni/n-GaAs Schottky Barrier Heights Formed on a Wafer by Controlling pH of Pretreatment Chemicals:Effect of Oxygen Adsorption (2000)
  • IIYAMA Koichi ID: 9000004838163

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Kanazawa University (2003 from CiNii)

    Articles in CiNii:1

    • Equivalent Circuit Model of InAlAs/InGaAs/InP Heterostructure Metal-Semiconductor-Metal Photodetectors (2003)
  • IIYAMA Koichi ID: 9000004843222

    Graduate School of Natural Science and Technology, Division of Electrical Engineering and Computer Science, Kanazawa University (2005 from CiNii)

    Articles in CiNii:1

    • Experimental Study of Lasing Characteristics of Brillouin/Erbium Optical Fiber Laser(Optoelectronics) (2005)
  • IIYAMA Koichi ID: 9000004875830

    the Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazawa University (2000 from CiNii)

    Articles in CiNii:1

    • Phase-Decorrelated FMCW Reflectometry for Long Optical Fiber Characterization by Using a Laser Diode with Modulated External-Cavity (2000)
  • IIYAMA Koichi ID: 9000004915591

    Faculty of Engineering, Kanazawa University (1997 from CiNii)

    Articles in CiNii:2

    • Mid-Range FMCW Reflectometry using a narrow-linewidth laser diode (1997)
    • (34)金沢大学電気・情報工学科における情報教育について(第10セッション 教育システム(V)) (1995)
  • IIYAMA Koichi ID: 9000014660337

    Division of Electrical Engineering and Computer Science, Graduate School of Natural Science and Technology, Kanazawa University (2006 from CiNii)

    Articles in CiNii:1

    • Extended-Range High-Resolution FMCW Reflectometry by Means of Electronically Frequency-Multiplied Sampling Signal Generated from Auxiliary Interferometer (2006)
  • IIYAMA Koichi ID: 9000017683852

    Division of Electrical Engineering and Computer Science, Graduate School of Natural Science and Technology, Kanazawa University (2008 from CiNii)

    Articles in CiNii:1

    • Avalanche Amplification in Silicon Lateral Photodiode Fabricated by Standard 0.18μm CMOS Process (2008)
  • IIYAMA Koichi ID: 9000018661748

    College of Science and Engineering School of Electrical and Computer Engineering, Kanazawa University (2009 from CiNii)

    Articles in CiNii:1

    • Bambi plan : project for the early detection of autism spectrum disorder using a NIRS/MEG integrated device (2009)
  • IIYAMA Koichi ID: 9000107333745

    Graduate School of Natural Science and Technology, Kanazawa University (2006 from CiNii)

    Articles in CiNii:1

    • Effect of Oxidation using Ultraviolet Light and Ozone and Subsequent Nitridation using Electron Cyclotron Resonance Plasma on Gate Portion of GaAs Field-Effect Transistors (2006)
  • IIYAMA Koichi ID: 9000107343409

    Graduate School of Natural Science and Technology, Kanazawa University (2005 from CiNii)

    Articles in CiNii:1

    • Mechanical Stress Caused by Adsorption of O or N on Ga-terminated (100) GaAs Surface and InAl-terminated (100) InAlAs Surface : Degradation of Insulator/Semiconductor Interface (2005)
  • IIYAMA Koichi ID: 9000107352746

    Graduate School of Natural Science and Technology, Kanazawa University (2005 from CiNii)

    Articles in CiNii:1

    • Studies of Effects of Adsorption of Silicon or Germanium on the Electronic States of (100) GaAs Surfaces (2005)
  • IIYAMA Koichi ID: 9000107366953

    Graduate School of Natural Science and Technology, Kanazawa University (2003 from CiNii)

    Articles in CiNii:1

    • Oxygen and Sulfur Adsorption Effects on Electronic States of GaAs(100) Surfaces Studied with Discrete Variational Xα Method (2003)
  • IIYAMA Koichi ID: 9000107377873

    Graduate School of Natural Science and Technology, Kanazawa University (2003 from CiNii)

    Articles in CiNii:1

    • Structural and Electrical Characterization of Oxidated, Nitridated and Oxi-nitridated (100) GaAs Surfaces (2003)
  • IIYAMA Koichi ID: 9000253691750

    Department of Electrical and Computer Engineering, Faculty of Techonology, Kanazawa University (1991 from CiNii)

    Articles in CiNii:1

    • Noise Measurement of Semiconductor Lasers. (1991)
  • IIYAMA Koichi ID: 9000345196550

    School of Electrical and Computer Engineering, Kanazawa University (2016 from CiNii)

    Articles in CiNii:1

    • Characterizing Silicon Avalanche Photodiode Fabricated by Standard 0.18µm CMOS Process for High-Speed Operation (2016)
  • IIYAMA Koichi ID: 9000396112888

    School of Electrical and Computer Engineering, Kanazawa University (2018 from CiNii)

    Articles in CiNii:1

    • High Speed and High Responsivity Avalanche Photodiode Fabricated by Standard CMOS Process in Blue Wavelength Region (2018)
  • Iiyama Koichi ID: 9000004871972

    the Faculty of Technology, Kanazawa University (1994 from CiNii)

    Articles in CiNii:1

    • Excellent Linearly Frequency-Swept Light Source for Sensing System Utilizing FMCW Technique (Special Issue on Electromagnetic Theory) (1994)
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