Search Results1-2 of  2

  • IMAJO YUJI ID: 9000001300932

    Kotobuki Industries Co., Ltd. (2011 from CiNii)

    Articles in CiNii:3

    • Measurement of Trapping Behavior of Dust Particles During Plasma Process by Suck-Out Method (2003)
    • Detection of Particles in Semiconductor Material Gases Using Light Scattering Method (2002)
    • Low Energy Dispersion of Titania Nanoparticles by Dual Axes Beads Mill (2011)
  • Imajo Yuji ID: 9000254255005

    Deparment of Chemical Engineering, Graduate School of Engineering, Hiroshima University (2002 from CiNii)

    Articles in CiNii:1

    • Detection of Particles in Semiconductor Material Gases Using Light Scattering Method. (2002)
Page Top