Search Results1-5 of  5

  • IMURA Kimihiko ID: 9000003307292

    Department of Materials Science,Hiroshima University:Electronics Laboratory,Nippon Mining Co.,Ltd. (1985 from CiNii)

    Articles in CiNii:1

    • On the Deep Level in Plastically Deformed Elemental Semiconductors (1985)
  • IMURA Kimihiko ID: 9000253323565

    Electronic Materials and Components Research Laboratories, Nippon Mining Co,, Ltd. (1986 from CiNii)

    Articles in CiNii:1

    • Large Diameter CdTe Single Crystals-Crystal Growth and the Evaluation (1986)
  • IMURA Kimihiko ID: 9000277506616

    Articles in CiNii:6

    • ポリシリコンTFTのスパッタSiO₂ゲート絶縁膜への低温アニール効果 (シリコン材料・デバイス) (2016)
    • ポリシリコンTFTのスパッタSiO₂ゲート絶縁膜への低温アニール効果 (有機エレクトロニクス) (2016)
    • Electrical Characterization of SiO_2 Films Deposited by RF Sputtering at Room Temperature Using O_2/Ar Mixture (2014)
  • Imura Kimihiko ID: 9000254561470

    Department of Materials Science, Hiroshima University (1985 from CiNii)

    Articles in CiNii:1

    • On the Deep Level in Plastically Deformed Elemental Semiconductors (1985)
  • Imura Kimihiko ID: 9000401853157

    Department of Materials Science, Hiroshima University (1985 from CiNii)

    Articles in CiNii:1

    • On the Deep Level in Plastically Deformed Elemental Semiconductors (1985)
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