Search Results41-60 of  73

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  • Ishihara Naganori ID: 9000252971503

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University (1989 from CiNii)

    Articles in CiNii:1

    • Off-Angle SiC(0001) Surface and Cu/SiC Interface Reaction (1989)
  • Ishihara Naganori ID: 9000252972356

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University (1990 from CiNii)

    Articles in CiNii:1

    • The Comparison of the Background Removal Methods in XPS Spectra (1990)
  • Ishihara Naganori ID: 9000252974549

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University (1990 from CiNii)

    Articles in CiNii:1

    • XPS Studies of 80 K-Phase Bi–Sr–Ca–Cu–O Single Crystals (1990)
  • Ishihara Naganori ID: 9000252988874

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University (1993 from CiNii)

    Articles in CiNii:1

    • Crystal Growth of Bi–Sr–Ca–Cu–O (<I>c</I><SUB>0</SUB>=39 Å) Single Crystals (1993)
  • Ishihara Naganori ID: 9000283837654

    Tottori University (2005 from CiNii)

    Articles in CiNii:1

    • Optimization of Cogeneration System in Local Commercial Area Using Genetic Algorithm (2005)
  • Ishihara Naganori ID: 9000341543819

    Articles in CiNii:1

    • The Surface Structure Analysis of a Heat-treated Metal/Si System by a Quantitative Auger Electron Spectroscopy Method (1988)
  • Ishihara Naganori ID: 9000391543934

    Tottori University (1993 from CiNii)

    Articles in CiNii:1

    • Comparison of Several Fuzzy Reasoning Methods on Driving Control for Right or Left Turning of a Model Car (1993)
  • Ishihara Naganori ID: 9000392681334

    Articles in CiNii:1

    • Thin Film Growth of Ag on KCl Studied by LEED-AES Experiments (1977)
  • Ishihara Naganori ID: 9000392699718

    Articles in CiNii:1

    • LEED-AES and XPS Studies of Bi–Sr–Ca–Cu–O Single Crystal Surfaces (1989)
  • Ishihara Naganori ID: 9000392701743

    Articles in CiNii:1

    • Surface Analysis of YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<I><SUB>x</SUB></I> and Bi–Sr–Ca–Cu–O Superconductors by Auger Electron Spectroscopy (1989)
  • Ishihara Naganori ID: 9000392703532

    Articles in CiNii:1

    • Effects of Preparation Conditions and Mechanical Polishing on the Superconducting Behavior of High-<I>T</I><SUB>c</SUB> Oxide Y<SUB>1</SUB>Ba<SUB>2</SUB>Cu<SUB>3</SUB>O<SUB>7−<I>y</I></SUB> (1988)
  • Ishihara Naganori ID: 9000392705425

    Articles in CiNii:1

    • A Micro-Quantitative AES Analysis Using SEM-SAM Apparatus (Applied to Ag/Si Interfaces on Si(111) and Si(100) Surfaces) (1986)
  • Ishihara Naganori ID: 9000392705451

    Articles in CiNii:1

    • Off-Angle SiC(0001) Surface and Cu/SiC Interface Reaction (1989)
  • Ishihara Naganori ID: 9000392707062

    Articles in CiNii:1

    • Direct Comparison of Fine Structure on Ti L<SUB>3</SUB> Threshold by Disappearance Potential and Auger Electron and Soft X-Ray Appearance Potential Spectroscopies (1984)
  • Ishihara Naganori ID: 9000392718384

    Articles in CiNii:1

    • XPS Studies of 80 K-Phase Bi–Sr–Ca–Cu–O Single Crystals (1990)
  • Ishihara Naganori ID: 9000392719315

    Articles in CiNii:1

    • X-Ray Photoelectron Spectroscopy Studies of 7 K-Phase Bi-System Single Crystals (1991)
  • Ishihara Naganori ID: 9000392722806

    Articles in CiNii:1

    • XPS Studies of Bi–Sr–Ca–Cu–O Single Crystal and Ceramics Surfaces (1989)
  • Ishihara Naganori ID: 9000392729925

    Articles in CiNii:1

    • LEED–AES Observations of 7 K- and 80 K-phase Bi–Sr–Ca–Cu–O Single Crystals (1989)
  • Ishihara Naganori ID: 9000392733156

    Articles in CiNii:1

    • The Comparison of the Background Removal Methods in XPS Spectra (1990)
  • Ishihara Naganori ID: 9000392734992

    Articles in CiNii:1

    • Crystal Growth of Bi–Sr–Ca–Cu–O (<I>c</I><SUB>0</SUB>=39 Å) Single Crystals (1993)
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