Search Results1-20 of  132

  • IWAMI Motohiro ID: 9000000236859

    Faculty of Science, Okayama University (1999 from CiNii)

    Articles in CiNii:2

    • Non-destructive Analysis of Thin Films Contact Systems : Present and Future (1999)
    • Non-destructive Analysis of Thin Films Contact Systems : Present and Future (1999)
  • IWAMI Motohiro ID: 9000003247092

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (2002 from CiNii)

    Articles in CiNii:22

    • Study on Ti/C-teminated 4H- and 6H-SiC interface reactions by soft X-ray emission spectroscopy (SXES) (2001)
    • Valence Band Density of States of Cu_3Si Studied by Soft X-Ray Emission Spectroscopy and a First-Principle Molecular Orbital Calculation (2002)
    • Electronic Energy States of Tungsten Dichalcogenides by Low Energy Electron Loss Spectroscopy Study (1981)
  • IWAMI Motohiro ID: 9000003272313

    Department of Electrical Engineering, Kyoto University:(Present address) Department of Electrical Engineering, Osaka University (1971 from CiNii)

    Articles in CiNii:1

    • Galvanomagnetic effects in single crystals of cadmium arsenide (1971)
  • IWAMI Motohiro ID: 9000005562997

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1994 from CiNii)

    Articles in CiNii:1

    • Influence of Interface Barrier on Lateral Transport Properties for Metal/Semiconductor Systems (1994)
  • IWAMI Motohiro ID: 9000020102956

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (2001 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (2001)
  • IWAMI Motohiro ID: 9000020104217

    The Graduate School of Natural Science and Technology, Okayama University (2001 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (2001)
  • IWAMI Motohiro ID: 9000020151060

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1990 from CiNii)

    Articles in CiNii:1

    • Soft X-ray spectroscopy and its application to surface region and interface study. (1990)
  • IWAMI Motohiro ID: 9000020196474

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1989 from CiNii)

    Articles in CiNii:1

    • A nondestructive analysis of surface layer by soft X-ray spectroscopy. (1989)
  • IWAMI Motohiro ID: 9000020272809

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1987 from CiNii)

    Articles in CiNii:1

    • Study of semiconductor surfaces and interfaces by using synchrotron radiation. (1987)
  • IWAMI Motohiro ID: 9000021548000

    Faculty of Engineering, Osaka University (1978 from CiNii)

    Articles in CiNii:1

    • High Dose Implantation of Au<SUP>+</SUP> and Cu<SUP>+</SUP>into Si Substrate (1978)
  • IWAMI Motohiro ID: 9000107307540

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (2003 from CiNii)

    Articles in CiNii:1

    • Non-destructive Analysis of Buried Interfaces and Surface Layers: X-Ray Emission Spectroscopic Study (2003)
  • IWAMI Motohiro ID: 9000107392891

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (2001 from CiNii)

    Articles in CiNii:1

    • Analysis of Nanostructure Formation Using Photon/Electron Spectroscopies: Cu on SiC Substrates (2001)
  • IWAMI Motohiro ID: 9000252845089

    Research Laboratory for Surface Science Faculty of Science, Okayama University. (1988 from CiNii)

    Articles in CiNii:1

    • A New Application of Soft X-Ray Spectros-copy (SXS) to Surface and Interface Studies (1988)
  • IWAMI Motohiro ID: 9000253648154

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1992 from CiNii)

    Articles in CiNii:1

    • Investigation of the Surfaces of Fluorine Contatining Acrylic Polymers by Critical Surface Tension of Wetting(.GAMMA.c) and ESCA. (1992)
  • IWAMI Motohiro ID: 9000253648235

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1993 from CiNii)

    Articles in CiNii:1

    • Study of Pd(Thin Film)/Si(Substrate) Interface by SXES Using Nondestructive Depth Profiling Technique. (1993)
  • IWAMI Motohiro ID: 9000253650405

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1988 from CiNii)

    Articles in CiNii:1

    • Fundamental surface studies for the development of hybrid devices. (1988)
  • IWAMI Motohiro ID: 9000257984145

    Research Laboratory of Surface Science, Okayama University (2012 from CiNii)

    Articles in CiNii:1

    • Initial Stage of Silicidation at Au/Si(111) Interfaces (2012)
  • Iwami Motohiro ID: 9000252764900

    Articles in CiNii:1

    • Structual Studies of Poly(Fluoroalkyl Methacrylate)s and Poly(Fluoroalkyl α-Fluoroacrylate)s (1992)
  • Iwami Motohiro ID: 9000252765101

    Research Laboratory for Surface Science, Faculty of Science, Okayama University (1992 from CiNii)

    Articles in CiNii:1

    • Nondestructive Depth Profiling Using Soft X-Ray Emission Spectroscopy by Incident Angle Variation Method (1992)
  • Iwami Motohiro ID: 9000252768294

    Department of Electrical Engineering, Kyoto University (1968 from CiNii)

    Articles in CiNii:1

    • Preparation of a High Mobility Thin Film of Cd<SUB>3</SUB>As<SUB>2</SUB> (1968)
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