Search Results1-12 of  12

  • Iwase Masao ID: 9000241656166

    Articles in CiNii:1

    • Ultralow Contact Resistivity for a Metal/p-Type Silicon Interface by High-Concentration Germanium and Boron Doping Combined with Low-Temperature Annealing (Crystal growth, surfaces, interfaces, thin films, and bulk materials) (2013)
  • Iwase Masao ID: 1000060362711

    Articles in CiNii:14

    • クロスオーバー研究による笑いのNK活性上昇効果の検討 (2004)
    • 笑いとストレス (特集 元気をもたらすストレス) (2005)
    • 統合失調症における化粧顔の認知に関する研究 (2006)
  • Iwase Masao ID: 9000004274725

    大阪大学大学院医学系研究科精神医学教室 (2016 from CiNii)

    Articles in CiNii:3

    • 科学が明かす笑いと健康 笑いと脳(第29回研究会) (2002)
    • Mirror neuron system dysfunction in autistic spectrum disorder revealed by spatial filtered magnetoencephalography (2013)
    • 統合失調症における補助診断ツールとしての眼球運動スコアの有用性 (2016)
  • Iwase Masao ID: 9000252968119

    ULSI Research Center, Toshiba Corporation (1989 from CiNii)

    Articles in CiNii:1

    • Electron Mobility in Si Inversion Layers (1989)
  • Iwase Masao ID: 9000252976155

    ULSI Research Center, Toshiba Corporation (1991 from CiNii)

    Articles in CiNii:1

    • Temperature Dependence of Electron Mobility in Si Inversion Layers (1991)
  • Iwase Masao ID: 9000280547951

    Articles in CiNii:1

    • Frontal midline theta rhythm and gamma power changes during focused attention on mental calculation: an MEG beamformer analysis (2014)
  • Iwase Masao ID: 9000392699109

    ULSI Research Center, Toshiba Corporation (1989 from CiNii)

    Articles in CiNii:1

    • Electron Mobility in Si Inversion Layers (1989)
  • Iwase Masao ID: 9000401611924

    Articles in CiNii:1

    • Electron Mobility in Si Inversion Layers (1989)
  • Iwase Masao ID: 9000401623142

    Articles in CiNii:1

    • Temperature Dependence of Electron Mobility in Si Inversion Layers (1991)
  • Iwase Masao ID: 9000402015801

    Articles in CiNii:1

    • Ultralow Contact Resistivity for a Metal/p-Type Silicon Interface by High-Concentration Germanium and Boron Doping Combined with Low-Temperature Annealing (2013)
  • Iwase Masao ID: 9000402018381

    Articles in CiNii:1

    • 2013-10-01 (2013)
  • Iwase Masao ID: 9000402024032

    Articles in CiNii:1

    • Reduction of surface roughness and defect density by cryogenic implantation of arsenic (2014)
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