Search Results1-20 of  37

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  • IWATA Seiichi ID: 9000000018831

    Central Research Laboratory, Hitachi, Ltd. (1998 from CiNii)

    Articles in CiNii:12

    • Detection of Electron- and Hole-traps in SiO_2/Si by ESCA (1996)
    • Time-Dependent Charging by X-ray Irradiation of Ultrathin SiO_2 films on Si (1996)
    • Detecting Small Amounts of Impurities and Defects in Silicon-oxide Films (1998)
  • IWATA Seiichi ID: 9000253649271

    Central Research Laboratory, Hitachi, Ltd.|Kurata Foundation, Shin Marubiru (1998 from CiNii)

    Articles in CiNii:1

    • Detecting Small Amounts of Impurities and Defects in Silicon-oxide Films. (1998)
  • Iwata Seiichi ID: 9000006135804

    Hitachi Hybrid Network Co., Ltd. (2006 from CiNii)

    Articles in CiNii:2

    • B-5-158 A Study of Communication Distance of 13.56MHz RFID Systems (2005)
    • B-10-41 Development of IMDD 2.5Gbit/s Y-00 Transceiver (2006)
  • Iwata Seiichi ID: 9000238477689

    Hitachi Information & Communication Engineering, Ltd. (2012 from CiNii)

    Articles in CiNii:1

    • B-19-12 Indoor Localization System for Stock Control Using UHF band RFID tags (2012)
  • Iwata Seiichi ID: 9000252953932

    Central Research Laboratory, Hitachi, Ltd. (1983 from CiNii)

    Articles in CiNii:1

    • Effects of Sputter Etching on Aluminum-Silicon Schottky Barrier Diode Characteristics (1983)
  • Iwata Seiichi ID: 9000253247513

    Central Research Laboratory, Hitachi, Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Evaluation of Adherence of CVD Tungsten Silicide Film to Polycrystalline Silicon (1989)
  • Iwata Seiichi ID: 9000255784347

    Central Research Laboratory, Hitachi, Ltd. (1991 from CiNii)

    Articles in CiNii:1

    • Corrosion Problems in ULSI's (1991)
  • Iwata Seiichi ID: 9000255899816

    Central Research Lab, Hitachi, Ltd. (1984 from CiNii)

    Articles in CiNii:1

    • Silicon Semiconductor Devices and Water (1984)
  • Iwata Seiichi ID: 9000255900052

    Central Research Lab., Hitachi, Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Can ULSI be Manufactured (1989)
  • Iwata Seiichi ID: 9000256655369

    Central Research Laboratory, Hitachi, Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • Problems in Applications of ESCA to Semiconductor Manufacturing Processes (1981)
  • Iwata Seiichi ID: 9000256655735

    Central Research Lab. Hitachi Ltd. (1983 from CiNii)

    Articles in CiNii:1

    • Characterization of Si-SiO<SUB>2</SUB> Interface (1983)
  • Iwata Seiichi ID: 9000256656280

    Central Research Lab., Hitachi, Ltd. (1986 from CiNii)

    Articles in CiNii:1

    • Gate electrode material for MOS VLSI's. (1986)
  • Iwata Seiichi ID: 9000256657184

    Central Research Laboratory, Hitachi, Ltd. (1991 from CiNii)

    Articles in CiNii:1

    • Finally, One More Word or Two (1991)
  • Iwata Seiichi ID: 9000256657190

    Central Research Laboratory, Hitachi, Ltd. (1991 from CiNii)

    Articles in CiNii:1

    • Industrial Application of Surface and Interface Analysis. Thickness Measurement of Ultra-thin Si Oxide Films by ESCA. (1991)
  • Iwata Seiichi ID: 9000283132374

    Central Research Laboratory, Hitachi, Ltd. (1986 from CiNii)

    Articles in CiNii:1

    • Corrosion of LSI Metallization Materials (1986)
  • Iwata Seiichi ID: 9000365532380

    Central Research Laboratory, Hitachi, Ltd. (1986 from CiNii)

    Articles in CiNii:1

    • Corrosion of LSI Metallization Materials (1986)
  • Iwata Seiichi ID: 9000391378012

    Central Research Laboratory, Hitachi, Ltd. (1986 from CiNii)

    Articles in CiNii:1

    • Corrosion of LSI Metallization Materials (1986)
  • Iwata Seiichi ID: 9000392688391

    Articles in CiNii:1

    • Effects of Sputter Etching on Aluminum-Silicon Schottky Barrier Diode Characteristics (1983)
  • Iwata Seiichi ID: 9000392791590

    Central Research Laboratory, Hitachi Ltd. (1978 from CiNii)

    Articles in CiNii:1

    • A Consideration on the Chemical Shift for Thin Insulating Films as Measured by ESCA (1978)
  • Iwata Seiichi ID: 9000392793283

    Central Research Laboratory, Hitachi, Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • Au Migration in Solutions Containing Various Ions (1981)
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