Search Results1-20 of  72

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  • Iwatsuki Masashi ID: 9000009548568

    Articles in CiNii:1

    • Elemental Analysis of Microareas by Electron Energy Analyzer (1976)
  • Iwatsuki Masashi ID: 9000009550961

    Articles in CiNii:1

    • Scanning Tunneling Microscope(STM)for Conventional Transmission Electron Microscope(TEM) (1991)
  • IWATSUKI Masashi ID: 9000001675853

    JEOL Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Mapping Contact Potential Differences with Noncontact Atomic Force Microscope Using Resonance Frequency Shift versus Sample Bias Voltage Curves (2005)
  • IWATSUKI Masashi ID: 9000003327228

    JEOL Ltd. (2000 from CiNii)

    Articles in CiNii:7

    • Detection of the flip-flop motion of buckled dimers on a Ge(001) surface by STM (1999)
    • Little Influence of Kinks on the Formation of c(4×2) Domains in a Si(001) Surface at Low Temperature (1998)
    • Low-Energy Electron Diffraction and Scanning Tunneling Microscopy Study on the Reconstruction of the Vanadium (111)Surface (1995)
  • IWATSUKI Masashi ID: 9000005658877

    JEOL Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Observation of 7x7 Reconstructed Structure on the Silicon(111)Surface using Ultrahigh Vacuum Voncontact Atomic Force Microscopy (1995)
  • IWATSUKI Masashi ID: 9000005673226

    JEOL Ltd. (1996 from CiNii)

    Articles in CiNii:1

    • Observation of Silicon Surfaces Using Ultrahigh - Vacuum Noncontact Atomic Force Microscopy (1996)
  • IWATSUKI Masashi ID: 9000107355607

    JEOL Ltd. (1997 from CiNii)

    Articles in CiNii:1

    • Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy (1997)
  • IWATSUKI Masashi ID: 9000252915575

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • A High-Temperature and Low-Temperature UHV-STM. (1993)
  • IWATSUKI Masashi ID: 9000253325475

    JEOL Ltd (1992 from CiNii)

    Articles in CiNii:1

    • Real-time observation of the Si surface with high-temperature UHV-STM (1992)
  • IWATSUKI Masashi ID: 9000253327701

    JEOL Ltd. (2001 from CiNii)

    Articles in CiNii:1

    • Application method for material science on semiconductor using SKPM with atomic resolution (2001)
  • IWATSUKI Masashi ID: 9000253649295

    JEOL Ltd. (1998 from CiNii)

    Articles in CiNii:1

    • Dynamic Behavior of Surface Atoms on Si(001) and Ge(001) Observed by Variable Temperature STM. (1998)
  • IWATSUKI Masashi ID: 9000255828756

    EM group R & D Section, JEOL Ltd. (1987 from CiNii)

    Articles in CiNii:1

    • Observation of Lattice Images of Silver Bromide Microcrystals by the Electron Microscope with a Superconducting Magnet Lens (1987)
  • IWATSUKI Masashi ID: 9000257978462

    JEOL Ltd. (1993 from CiNii)

    Articles in CiNii:1

    • Future Technology for High Quality Printing. Scanning Tunneling Microscope. (1993)
  • IWATSUKI Masashi ID: 9000257982202

    JEOL Ltd. (2000 from CiNii)

    Articles in CiNii:1

    • The 29th Surface Science Technical Meeting:—Recent Progress of Scanning Probe Microscopy— (2000)
  • Iwatsuki Masashi ID: 9000015620468

    Articles in CiNii:52

    • Dynamic Behavior of Surface Atoms on Si(001)and Ge(001) Observed by Variable Temperature STM (1998)
    • SEM/TEM-combined SPM (1996)
    • Effects of Sample Bias Voltage in UHV NC-AFM Observation (1999)
  • Iwatsuki Masashi ID: 9000023668275

    Articles in CiNii:1

    • High-resolution Observation of Polymer Single Crystals with a Superconducting Cryo-TEM (Commemoration Issue Dedicated to Professor Ken-ichi Katayama On the Occasion of His Retirement) (1991)
  • Iwatsuki Masashi ID: 9000252962273

    JEOL Ltd. (1987 from CiNii)

    Articles in CiNii:1

    • Cryogenic Transmission Electron Microscopy of High <I>T</I><SUB>c</SUB> Ba–Yb–Cu Perovskite Oxide (1987)
  • Iwatsuki Masashi ID: 9000252962641

    JEOL Ltd. (1987 from CiNii)

    Articles in CiNii:1

    • Electron Diffraction and Microscopy of the Structures of La–Ba(Sr)–Cu Oxides at Liquid Helium Temperature (1987)
  • Iwatsuki Masashi ID: 9000252970327

    JEOL Ltd. (1989 from CiNii)

    Articles in CiNii:1

    • Low-Temperature Electron Microscopy of a Bi<SUB>2</SUB>(Sr, Ca)<SUB>3</SUB>Cu<SUB>2</SUB>O<I><SUB>x</SUB></I> Superconductor (1989)
  • Iwatsuki Masashi ID: 9000252983673

    JEOL Ltd. (1992 from CiNii)

    Articles in CiNii:1

    • Scanning Tunneling Microscopy Study of the 16-Structure Appearing on a Si(110) Surface (1992)
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