Search Results1-20 of  55

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  • Ikenaga Eiji ID: 9000010130333

    Articles in CiNii:1

    • Adsorption of (CH3)2S on c(10×2)Ag/Cu(100) Studied by S K-edge NEXAFS and XPS (2005)
  • Ikenaga Eiji ID: 9000018934199

    Articles in CiNii:1

    • Fabrication of Graphene Directly on SiO₂ without Transfer Processes by Annealing Sputtered Amorphous Carbon (Special Issue : Solid State Devices and Materials (2)) (2012)
  • Ikenaga Eiji ID: 9000241565119

    Articles in CiNii:1

    • Spectroscopic Analysis of Graphitization and Grain Orientation of Carbon Films Grown by Photoemission-Assisted Plasma-Enhanced Chemical Vapor Deposition (2013)
  • Ikenaga Eiji ID: 9000336375463

    Articles in CiNii:1

    • Ce Core-Level Spectroscopy, and Magnetic and Electrical Transport Properties of Lightly Ce-Doped YCoO₃ (2016)
  • Ikenaga Eiji ID: 9000356897207

    Articles in CiNii:1

    • Microbeam Hard X-ray Photoemission Study on Platinum-Group Metal Pernitrides (2017)
  • Ikenaga Eiji ID: 9000367020031

    Articles in CiNii:1

    • First Observation of Heavy Fermion Behavior in Ce-Based Icosahedral Approximant (2017)
  • Ikenaga Eiji ID: 9000382645888

    Articles in CiNii:1

    • Observation of a Pseudogap in the Vicinity of the Metal-Insulator Transition in the Perovskite-type Vanadium Oxides Nd₁₋xSr[x]VO₃ (2018)
  • Eiji Ikenaga ID: 9000404091310

    Articles in CiNii:1

    • Spectroscopic and theoretical investigation of the electronic states of layered perovskite oxyfluoride Sr2RuO3F2 thin films (2018)
  • IKENAGA Eiji ID: 9000005890364

    Department of Physical Sciences, Hiroshima University (2000 from CiNii)

    Articles in CiNii:1

    • Electron-Ion Coincidence Spectroscopy as aNew Tool for Surface Analysis an Application to Ice Surface (2000)
  • IKENAGA Eiji ID: 9000014597074

    Japan Synchrotron Radiation Research Institute (2009 from CiNii)

    Articles in CiNii:3

    • Electric characteristics of Si_3N_4 films formed by directly radical nitridation on Si (110) and Si (100) surfaces (2006)
    • Study on Compositional Transition Layers at Gate Dielectrics/Si Interface by using Angle-resolved X-ray Photoelectron Spectroscopy (2009)
    • Study on Compositional Transition Layers at Gate Dielectrics/Si Interface by using Angle-resolved X-ray Photoelectron Spectroscopy (2009)
  • IKENAGA Eiji ID: 9000016374935

    Articles in CiNii:2

    • Hard X-ray Photoemission Spectroscopy Combined with Magnetic Circular Dichroism : Application to Fe_<3-x>Zn_xO_4 Spinel Oxide Thin Films (2008)
    • Magnetic dichroism in angle-resolved hard x-ray photoemission from buried layers (2011)
  • IKENAGA Eiji ID: 9000045655918

    Articles in CiNii:1

    • Construction of a Soft X-ray Diffractometer and Its Application to Symmetry Determination of Ferroelectric Ca_2Sr(C_2H_5CO_2)_6 in the Phase III (2005)
  • IKENAGA Eiji ID: 9000260372612

    Japan Synchrotron Radiation Research Institute/SPring-8 (2008 from CiNii)

    Articles in CiNii:2

    • In-gap Electronic States Responsible for the Excellent Thermoelectric Properties of Ni-based Half-Heusler Alloys (2008)
    • Hard X-ray Photoemission Spectroscopy of Temperature-Induced Valence Transition in EuNi_2(Si_<0.20>Ge_<0.80>)_2 (2004)
  • Ikenaga Eiji ID: 9000025031429

    Articles in CiNii:1

    • Effect of oxide charge trapping on X-ray photoelectron spectroscopy of HfO2/SiO2/Si structures (2009)
  • Ikenaga Eiji ID: 9000063205967

    Articles in CiNii:1

    • Effect of Carrier Gas (Ar and He) on the Crystallographic Quality of Networked Nanographite Grown on Si Substrates by Photoemission-Assisted Plasma-Enhanced Chemical Vapor Deposition (2010)
  • Ikenaga Eiji ID: 9000066344080

    Articles in CiNii:1

    • Electric Characteristics of Si3N4Films Formed by Directly Radical Nitridation on Si(110) and Si(100) Surfaces (2007)
  • Ikenaga Eiji ID: 9000241509246

    Articles in CiNii:68

    • 電子-イオン・コインシデンス分光法を用いた固体表面における光刺激イオン脱離の研究 (2000)
    • High resolution X-ray photoelectron spectroscopy study on Si_3N_4/Si interface structures and its correlation electrical properties by NH^* direct nitridation process (2005)
    • The dependence of the intermediate nitridation states density at Si_3N_4/Si interface on surface Si atoms density (2006)
  • Ikenaga Eiji ID: 9000258153187

    Department of Physical Sciences, Hiroshima University, Higashi-Hiroshima 739-8526, Japan (2000 from CiNii)

    Articles in CiNii:1

    • Electron-Ion Coincidence Spectroscopy as a New Tool for Surface Analysis. An Application to the Ice Surface. (2000)
  • Ikenaga Eiji ID: 9000258198159

    JASRI/SPring-8 (2004 from CiNii)

    Articles in CiNii:1

    • Hard X-ray Photoemission Spectroscopy of Temperature-Induced Valence Transition in EuNi2(Si0.20Ge0.80)2 (2004)
  • Ikenaga Eiji ID: 9000258199616

    JASRI/SPring-8 (2005 from CiNii)

    Articles in CiNii:1

    • Construction of a Soft X-ray Diffractometer and Its Application to Symmetry Determination of Ferroelectric Ca2Sr(C2H5CO2)6 in the Phase III (2005)
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