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  • Inoue Tomoki ID: 9000401696264

    Articles in CiNii:1

    • Improvement of Channel Mobility for Trench Metal-Oxide-Semiconductor Field Effect Transistor by Smoothing Trench Sidewall Surface (2001)
  • Inoue Tomoki ID: 9000401969119

    Department of Physics, Saga University, Saga 840-8502, Japan (2014 from CiNii)

    Articles in CiNii:1

    • Impurity Effect on the Inter-Chain Dielectric Response of the CDW Condensate in K0.3MoO3 (2014)
  • Tomoki Inoue ID: 9000308049660

    Department of Mechanical Engineering, University of Tokushima (2013 from CiNii)

    Articles in CiNii:1

    • 1025 LAMINAR-TURBULENT TRANSITION OF THE FLAT-PLATE BOUNDARY LAYER BY A LINE OF ROUGHNESS ELEMENTS (Variation of Turbulence Energy Due to Interference of Turbulence Wedges) (2013)
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