Search Results1-18 of  18

  • Ishihara Toyoyuki ID: 9000403064153

    Articles in CiNii:1

    • Charge states of fast ions in glancing collisions with aligned atoms in Si crystals (1994)
  • Ishihara Toyoyuki ID: 9000403064161

    Articles in CiNii:1

    • Secondary electrons induced by fast ions under channeling conditions. III. Unshadowed electrons in target crystals (1993)
  • Ishihara Toyoyuki ID: 9000403070666

    Articles in CiNii:1

    • Secondary electrons induced by fast ions under channeling conditions. II. Screening of fast heavy ions in solids (1991)
  • Ishihara Toyoyuki ID: 9000002413242

    Tandem Accelerator Center,Tsukuba University (2001 from CiNii)

    Articles in CiNii:40

    • 筑波大タンデム加速器の現状 (第10回タンデム加速器及びその周辺技術の研究会--1997年7月7日、8日 国立環境研究所大山記念ホール) -- (加速器の現状と将来計画(1)) (1998)
    • Modified Conductivity of Polymer Materials with Proton Beam (2001)
    • 25p-G-10 Ion-beam shadowing effect under small Bohr parameter conditions (1991)
  • Ishihara Toyoyuki ID: 9000252974202

    Tandem Accelerator Center, University of Tsukuba (1990 from CiNii)

    Articles in CiNii:1

    • Determination of the Crystallographic Polarity of Zincblende Structure by Using Ion-Induced Secondary Electrons (1990)
  • Ishihara Toyoyuki ID: 9000252984151

    Tandem Accelerator Center, University of Tsukuba (1992 from CiNii)

    Articles in CiNii:1

    • Shadowing Pattern Imaging with High-Energy Secondary Electrons Induced by Fast Ions (1992)
  • Ishihara Toyoyuki ID: 9000252989159

    Articles in CiNii:1

    • Surface Layer Analysis of Sputter-Etched Si Using Secondary Electrons Induced by Fast Ions (1993)
  • Ishihara Toyoyuki ID: 9000254785329

    Radiation Science Center, High Energy Accelerator Research Organization (2002 from CiNii)

    Articles in CiNii:1

    • Measurement of the Spatial Distribution of Neutrons in an Accelerator Room by the Combination of Activation Detectors and an Imaging Plate (2002)
  • Ishihara Toyoyuki ID: 9000258130441

    Tandem Accelerator Center, University of Tsukuba, Tsukuba, Ibaraki 305, Japan (1996 from CiNii)

    Articles in CiNii:1

    • Planar Shadowing of Fast Ion Beams in Si and Ge Crystals Bombarded with 5keV Ar+. (1996)
  • Ishihara Toyoyuki ID: 9000283157957

    Articles in CiNii:1

    • Characteization of Epitaxially Grown CeO2(110) Layers on Si by Means of Shadowing Pattern Imaging with Fast Ion Beams. (1994)
  • Ishihara Toyoyuki ID: 9000392722170

    Articles in CiNii:1

    • Determination of the Crystallographic Polarity of Zincblende Structure by Using Ion-Induced Secondary Electrons (1990)
  • Ishihara Toyoyuki ID: 9000392725112

    Articles in CiNii:1

    • Shadowing Pattern Imaging with High-Energy Secondary Electrons Induced by Fast Ions (1992)
  • Ishihara Toyoyuki ID: 9000401619758

    Articles in CiNii:1

    • Determination of the Crystallographic Polarity of Zincblende Structure by Using Ion-Induced Secondary Electrons (1990)
  • Ishihara Toyoyuki ID: 9000401631170

    Articles in CiNii:1

    • Shadowing Pattern Imaging with High-Energy Secondary Electrons Induced by Fast Ions (1992)
  • Ishihara Toyoyuki ID: 9000401639425

    Articles in CiNii:1

    • Surface Layer Analysis of Sputter-Etched Si Using Secondary Electrons Induced by Fast Ions (1993)
  • Ishihara Toyoyuki ID: 9000401645947

    Articles in CiNii:1

    • Characterization of Epitaxially Grown $\bf CeO_2(110)$ Layers on Si by Means of Shadowing Pattern Imaging with Fast Ion Beams (1994)
  • Ishihara Toyoyuki ID: 9000401651888

    Articles in CiNii:1

    • High-Sensitivity Channeling Analysis of Lattice Disorder Near Surfaces Using Secondary Electrons Induced by Fast Ions (1995)
  • Ishihara Toyoyuki ID: 9000401656329

    Articles in CiNii:1

    • Planar Shadowing of Fast Ion Beams in Si and Ge Crystals Bombarded with 5 keVAr+ (1996)
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