Search Results1-20 of  118

  • Ishitani Tohru ID: 9000379591512

    Articles in CiNii:1

    • Homodimerization of nemo-like kinase is essential for activation and nuclear localization (2011)
  • Ishitani Tohru ID: 9000009551626

    Articles in CiNii:1

    • Transmission Electron Microscope Sample Preparation Using a Focused Ion Beam (1994)
  • Ishitani Tohru ID: 9000344119559

    Articles in CiNii:1

    • Context-dependent regulation of the β-catenin transcriptional complex supports diverse functions of Wnt/β-catenin signaling (Wnt Signaling : Biological Functions and Its Implications in Diseases) (2017)
  • ISHITANI TOHRU ID: 9000022170892

    Central Research Lab., Hitachi, Ltd. (1975 from CiNii)

    Articles in CiNii:1

    • Qualltitatiue Analysis of Low Alloy Steel with an Ion Microanalyzer (1975)
  • ISHITANI TOHRU ID: 9000022180059

    Central Research Laboratory, Hitachi Ltd., (1976 from CiNii)

    Articles in CiNii:1

    • Surface Analyzer Combining Secondary Ion Mass Spectrometry and Ion Scattering Spectrometry (1976)
  • ISHITANI Tohru ID: 9000000131952

    日立製作所計測器グループ (2000 from CiNii)

    Articles in CiNii:2

    • Focused-ion-beam system (1997)
    • Ion Microscope (SIM & FIM) (2000)
  • ISHITANI Tohru ID: 9000000788016

    Instrument Division, Hitachi Ltd (1995 from CiNii)

    Articles in CiNii:1

    • Focused-Ion-Beam Digging of Biological Specimens (1995)
  • ISHITANI Tohru ID: 9000000788197

    Instrument Division, Hitachi, Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Calculation of Local Temperature Rise in Focused-Ion-Beam Sample Preparation (1995)
  • ISHITANI Tohru ID: 9000000790874

    Beam Technology Center, Instruments, Hitachi, Ltd. (1999 from CiNii)

    Articles in CiNii:1

    • A general expression of beam intensity distribution subjected to spherical aberration (1999)
  • ISHITANI Tohru ID: 9000001034697

    Naka Division. Hitachi High-Technologies Corporation (2003 from CiNii)

    Articles in CiNii:1

    • Comparative study of depth and lateral distributions of electron excitation between scanning ion and scanning electron microscopes (2003)
  • ISHITANI Tohru ID: 9000001070177

    Naka Division, Hitachi High-Technologies Corporation (2002 from CiNii)

    Articles in CiNii:1

    • Origins of material contrast in scanning ion microscope images (2002)
  • ISHITANI Tohru ID: 9000001198362

    Naka Division, Design and Manufacturing Group, Hitachi High-Technologies Corporation (2002 from CiNii)

    Articles in CiNii:1

    • Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy (2002)
  • ISHITANI Tohru ID: 9000001287511

    Naka Division, Hitachi High-Technologies Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Monte Carlo simulation of topographic contrast in scanning ion microscope (2004)
  • ISHITANI Tohru ID: 9000001287515

    Naka Division, Hitachi High-Technologies Corporation (2004 from CiNii)

    Articles in CiNii:1

    • Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy (2004)
  • ISHITANI Tohru ID: 9000001650771

    Nanotechnology Products Business Group, Hitachi High-Technologies Corp. (2005 from CiNii)

    Articles in CiNii:1

    • Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy (2005)
  • ISHITANI Tohru ID: 9000002045221

    Nanotechnology Products Business Group, Hitachi High-Technologies Corporation (2006 from CiNii)

    Articles in CiNii:1

    • Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy (2006)
  • ISHITANI Tohru ID: 9000005522760

    Department of Applied Physics, Faculty of Engineering, Osaka University (1971 from CiNii)

    Articles in CiNii:1

    • Monte Carlo Simulations of the Behavior of Energetic Light Ions in Solids (1971)
  • ISHITANI Tohru ID: 9000005526735

    Department of Applied Physics, Osaka University (1974 from CiNii)

    Articles in CiNii:1

    • Fundamental Studies on Quantitative Analysis in Ion Probe Microanalyzer (1974)
  • ISHITANI Tohru ID: 9000005527657

    Naka Division, Hitachi High-Technologies Corporation (2004 from CiNii)

    Articles in CiNii:6

    • Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction (2004)
    • Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10kV and 40kV (2004)
    • Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell (2004)
  • ISHITANI Tohru ID: 9000005567962

    Instrument Division, Hitachi, Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Monte Carlo Simulation of Ion Bombardment at Low Glancing Angles (1995)
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