Search Results81-96 of  96

  • 5 / 5
  • Kanemaru Seigo ID: 9000401697396

    Articles in CiNii:1

    • Electron Motion Three-Dimensional Confinement for Microelectronic Vacuum Gauges with Field Emitters (2001)
  • Kanemaru Seigo ID: 9000401698156

    Articles in CiNii:1

    • Charging Damage of Silicon-on-Insulator (SOI) Wafer Determined by Scanning Maxwell-Stress Microscopy (2001)
  • Kanemaru Seigo ID: 9000401708177

    Articles in CiNii:1

    • Close Observation of the Geometrical Features of an Ultranarrow Silicon Nanowire Device (2002)
  • Kanemaru Seigo ID: 9000401708925

    Articles in CiNii:1

    • Mechanism of Tungsten Plug Corrosion during Chemical Stripping Process: Scanning Maxwell-Stress Microscopy and Electrochemical Potentiometry Studies (2002)
  • Kanemaru Seigo ID: 9000401709369

    Articles in CiNii:1

    • Dual-Gate Electron Emission Structure with Nanotube-on-Emitter for X-Ray Generation (2002)
  • Kanemaru Seigo ID: 9000401709792

    Articles in CiNii:1

    • Oscillator Ionization Vacuum Gauge with Field Emitters (2002)
  • Kanemaru Seigo ID: 9000401714907

    Articles in CiNii:1

    • Fabrication of ultrathin Si Channel Wall For Vertical Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistor (DG MOSFET) by Using Ion-Bombardment-Retarded Etching (IBRE) (2003)
  • Kanemaru Seigo ID: 9000401715520

    Articles in CiNii:1

    • Programmable Conductivity of Silicon Nanowires with Side Gates by Surface Charging (2003)
  • Kanemaru Seigo ID: 9000401717380

    Articles in CiNii:1

    • Novel Process for Vertical Double-Gate (DG) Metal-Oxide-Semiconductor Field-Effect-Transistor (MOSFET) Fabrication (2003)
  • Kanemaru Seigo ID: 9000401726379

    Articles in CiNii:1

    • Modeling of Focused Carbon Nanotube Array Emitters for Field-Emission Displays (2004)
  • Kanemaru Seigo ID: 9000401727053

    Articles in CiNii:1

    • Fabrication of Polycrystalline Silicon Field Emitter Arrays with Hafnium Carbide Coating for Thin-Film-Transistor Controlled Field Emission Displays (2004)
  • Kanemaru Seigo ID: 9000401737595

    Articles in CiNii:1

    • General Analytical Relationship for Electric Field of Gated Field Emitters (2005)
  • Kanemaru Seigo ID: 9000401739550

    Articles in CiNii:1

    • Fabrication of HfC-Coated Si Field Emitter Arrays with Built-in Poly-Si Thin-Film Transistor (2005)
  • Kanemaru Seigo ID: 9000401739797

    Articles in CiNii:1

    • Emission Statistics for HfC Emitter Arrays after Residual Gas Exposure (2005)
  • Kanemaru Seigo ID: 9000401780622

    Articles in CiNii:1

    • Fabrication of a Field Emitter Array with a Built-in Einzel Lens (2009)
  • Kanemaru Seigo ID: 9000401994167

    Articles in CiNii:1

    • Nanoscale Evaluation of Structure and Surface Potential of Gated Field Emitters by Scanning Maxwell-Stress Microscope (1995)
  • 5 / 5
Page Top