Search Results1-6 of  6

  • Kaneyama Toshikatsu ID: 9000009551037

    Articles in CiNii:1

    • Identification of Lattice Defects by Convergent-Beam Electron Diffraction (High Technology Materials-3-<Special Issue>) (1991)
  • Kaneyama Toshikatsu ID: 9000025121506

    Articles in CiNii:1

    • Achieving 63pm resolution in scanning transmission electron microscope with spherical aberration corrector (2007)
  • KANEYAMA Toshikatsu ID: 9000258233967

    JEOL Ltd. (2012 from CiNii)

    Articles in CiNii:1

    • Innovative electron microscope for light-element atom visualization:— Development of low-voltage electron microscopes in Triple-C project — (2012)
  • Kaneyama Toshikatsu ID: 9000257783500

    JEOL Ltd., Japan (2012 from CiNii)

    Articles in CiNii:1

    • Surface Imaging by ABF-STEM: Lithium Ions in Diffusion Channel of LIB Electrode Materials (2012)
  • Kaneyama Toshikatsu ID: 9000283624089

    JEOL Ltd. (2011 from CiNii)

    Articles in CiNii:1

    • Innovative electron microscope for light-element atom visualization - Development of low-voltage electron microscopes in "Triple-C" project -:- Development of low-voltage electron microscopes in “Triple-C” project - (2011)
  • Kaneyama Toshikatsu ID: 9000401765878

    Articles in CiNii:1

    • Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector (2007)
Page Top