Search Results1-5 of  5

  • KATAGAWA Takeshi ID: 9000003241911

    Department of Applied Physics, Faculty of Engineering, Nagoya University (1965 from CiNii)

    Articles in CiNii:1

    • Absolute Measurement of Structure Factors of Si Single Crystal by Means of X-Ray Pendellosung Fringes (1965)
  • KATAGAWA Takeshi ID: 9000020028182

    Articles in CiNii:1

    • Computer Simulation of X-ray Diffraction Topographs of Plate-like Defects (1978)
  • KATAGAWA Takeshi ID: 9000020108490

    ULVAC Japan Ltd. (1988 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1988)
  • Katagawa Takeshi ID: 9000254543376

    Department of Applied Physics, Faculty of Engineering, Nagoya University (1965 from CiNii)

    Articles in CiNii:1

    • Absolute Measurement of Structure Factors of Si Single Crystal by Means of X-Ray Pendellösung Fringes (1965)
  • Katagawa Takeshi ID: 9000401822292

    Department of Applied Physics, Faculty of Engineering, Nagoya University (1965 from CiNii)

    Articles in CiNii:1

    • 1965-06-15 (1965)
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